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The discovery of ferroelectric (FE) properties in binary oxides has enabled CMOS compatible and scalable FE memories. Recently, we reported a simple approach to introduce non-volatility into state-of-the-art dynamic random-access memory stacks that show anti-FE (AFE) behavior. By employing a pair of electrodes with different work functions, a built-in bias is generated. Consequently, this bias modulates the energy potential of the AFE and enables two stable non-volatile states. Using this approach, a significant endurance improvement compared to hafnia-based FE memories can be obtained. In this paper, we investigate the possibility to bypass the usage of asymmetric workfunction electrodes. Using the interface-engineering approach, based on fixed charge or dipole formation, we show two additional methods for built-in bias generation within AFE layer stacks. By characterizing the film properties and performance of AFE capacitors, we compare and investigate retention and endurance of both work function-difference-based and interface-based AFE non-volatile memory. Finally, for the first time we present the concept of a binary oxide-based AFE tunnel junction that leverages both an interface and work function engineered AFE stack.

We have embedded a small Josephson junction in a microwave resonator that allows simultaneous dc biasing and dispersive readout. Thermal fluctuations drive the junction into phase diffusion and induce a temperature-dependent shift in the resonance frequency. By sensing the thermal noise of a remote resistor in this manner, we demonstrate primary thermometry in the range from 300 mK to below 100 mK, and high-bandwidth (7.5 MHz) operation with a noise-equivalent temperature of better than 10 $\mathrm{\mu K/\sqrt{Hz}}$. At a finite bias voltage close to a Fiske resonance, amplification of the microwave probe signal is observed. We develop an accurate theoretical model of our device based on the theory of dynamical Coulomb blockade., Comment: (v2) Added data on high-power readout; Reformatted and restructured main text; Language and typographical fixes

A superconductor-normal metal-superconductor (SNS) transistor based on superconducting microcoolers is presented. The proposed 4-terminal device consists of a long SNS Josephson junction whose N region is in addition symmetrically connected to superconducting reservoirs through tunnel barriers (I). Biasing the SINIS line allows to modify the quasiparticle temperature in the weak link, thus controlling the Josephson current. We show that, in suitable voltage and temperature regimes, large supercurrent enhancements can be achieved with respect to equilibrium, due to electron ``cooling'' generated by the control voltage. The extremely low power dissipation intrinsic to the structure makes this device relevant for a number of electronic applications., 4 pages, 3 figures, to appear in Applied Physics Letters

Scanning Tunneling Microscopy (STM) is a technique where the surface topography of a conducting sample is probed by a scanning metallic tip. The tip-to-surface distance is controlled by monitoring the electronic tunneling current between the two metals. The aim of this work is to extend the temporal range of this instrument by characterising the time fluctuations of this current on different surfaces. The current noise power spectral density is dominated by a characteristic 1/f component, the physical origin of which is not yet clearly identified, despite a number of investigations. A new I-V preamplifier was developed in order to characterise these fluctuations of the tunnelling current and to obtain images of their spatial repartition. It is observed that their intensity is correlated with some topographical features. This information can be used to get insights on the physical phenomena involved that are not accessible by the usual STM set-up, which is limited to low frequencies.