1. RF Pogo-Pin Probe Card Design Aimed at Automated Millimeter-Wave Multi-Port Integrated-Circuit Testing
- Author
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Kwang-Eog Lee, Min-Soo Kim, Tae Seon Kim, Junghwan Oh, and Min-Ki Kim
- Subjects
TK7800-8360 ,Computer Networks and Communications ,Pogo pin ,business.industry ,Computer science ,Electrical engineering ,RF probe cards ,Integrated circuit ,RF probe ,law.invention ,Hardware and Architecture ,Control and Systems Engineering ,law ,Signal Processing ,Extremely high frequency ,Insertion loss ,Maximum power transfer theorem ,Pogo-pin probes ,Electrical and Electronic Engineering ,Electronics ,business ,Probe card ,Electronic circuit ,automized RF testing - Abstract
A prototype RF probe card is assembled to test the feasibility of Pogo-pins as robust probe tips for the automized testing of multiple-port millimeter-wave circuits. A custom-made ceramic housing machined from a low-loss dielectric holds an array of 157 Pogo-pins, each with 2.9 mm-length in fixed positions. The ceramic housing is then mounted onto a probe-card PCB for power-loss measurements on two signal-ground Pogo-pin connections arbitrarily selected from the array. The probing results on a test circuit with a simple thru-line indicate a successful power transfer with a small insertion loss of less than 0.5 dB per single Pogo-pin connection up to 25 GHz. A new probe card design using shorter Pogo-pins is being prepared to extend the operation frequency to beyond 40 GHz.
- Published
- 2021