Search

The crystal structure and transformation path from austenite to 10M martensite in Ni–Mn–Ga single crystal are examined employing high‐energy synchrotron radiation, scanning, and transmission electron microscopy. Using temperature gradient, an austenite/twinned martensite interface is stabilized revealing the crystal structure and microstructure of both phases and the transformation sequence across the interface. Depending on the distance from the interface, three distinct types of martensite crystal lattice, namely simple tetragonal and two monoclinic modulated ones, that is, 10M′ and 10M are confirmed. In situ measurements show that lattice mismatch formed at the habit plane is compensated by the formation of micro‐twinned and branched martensite along with an elastic change in lattice parameters. It is shown that the characteristics for periodic shuffling twin boundaries, such as modulation twins or inverted stacking faults, are installed in later stages of transformation. In other words, large microstructure elements that most efficiently accommodate the strain are installed first, and then smaller elements are operable. Overall, the experimental results show that the crystal lattice does not adapt modulated phase at the habit plane and cannot be built up from simple non‐modulated tetragonal blocks but rather a specific sequence of phase transformations using shear/shuffling deformation takes place. [ABSTRACT FROM AUTHOR]

A band width determination using the first derivative of the band profile systematically underestimates the true Bragg angle. Corrections are proposed to compensate for the resulting offset Δa/a of the mean lattice parameters derived from as many Kikuchi band widths as possible. For dynamically simulated Kikuchi patterns, Δa/a can reach up to 8% for phases with a high mean atomic number Z, whereas for much more common low‐Z materials the offset decreases linearly. A predicted offset Δa/a = f(Z) is therefore proposed, which also includes the unit‐cell volume and thus takes into account the packing density of the scatterers in the material. Since Z is not always available for unknown phases, its substitution by Zmax, i.e. the atomic number of the heaviest element in the compound, is still acceptable for an approximate correction. For simulated Kikuchi patterns the offset‐corrected lattice parameter deviation is Δa/a < 1.5%. The lattice parameter ratios, and the angles α, β and γ between the basis vectors, are not affected at all. [ABSTRACT FROM AUTHOR]

A pseudosymmetric description of the crystal lattice derived from a single wide‐angle Kikuchi pattern can have several causes. The small size (<15%) of the sector covered by an electron backscatter diffraction pattern, the limited precision of the projection centre position and the Kikuchi band definition are crucial. Inherent pseudosymmetries of the crystal lattice and/or structure also pose a challenge in the analysis of Kikuchi patterns. To eliminate experimental errors as much as possible, simulated Kikuchi patterns of 350 phases have been analysed using the software CALM [Nolze et al. (2021). J. Appl. Cryst.54, 1012–1022] in order to estimate the frequency of and reasons for pseudosymmetric crystal lattice descriptions. Misinterpretations occur in particular when the atomic scattering factors of non‐equivalent positions are too similar and reciprocal‐lattice points are systematically missing. As an example, a pseudosymmetry prediction depending on the elements involved is discussed for binary AB compounds with B1 and B2 structure types. However, since this is impossible for more complicated phases, this approach cannot be directly applied to compounds of arbitrary composition and structure. [ABSTRACT FROM AUTHOR]

The derivation of a crystal structure and its phase‐specific parameters from a single wide‐angle backscattered Kikuchi diffraction pattern requires reliable extraction of the Bragg angles. By means of the first derivative of the lattice profile, an attempt is made to determine fully automatically and reproducibly the band widths in simulated Kikuchi patterns. Even under such ideal conditions (projection centre, wavelength and lattice plane traces are perfectly known), this leads to a lattice parameter distribution whose mean shows a linear offset that correlates with the mean atomic number Z of the pattern‐forming phase. The consideration of as many Kikuchi bands as possible reduces the errors that typically occur if only a single band is analysed. On the other hand, the width of the resulting distribution is such that higher image resolution of diffraction patterns, employing longer wavelengths to produce wider bands or the use of higher interference orders is less advantageous than commonly assumed. [ABSTRACT FROM AUTHOR]

A new software is presented for the determination of crystal lattice parameters from the positions and widths of Kikuchi bands in a diffraction pattern. Starting with a single wide‐angle Kikuchi pattern of arbitrary resolution and unknown phase, the traces of all visibly diffracting lattice planes are manually derived from four initial Kikuchi band traces via an intuitive graphical user interface. A single Kikuchi bandwidth is then used as reference to scale all reciprocal lattice point distances. Kikuchi band detection, via a filtered Funk transformation, and simultaneous display of the band intensity profile helps users to select band positions and widths. Bandwidths are calculated using the first derivative of the band profiles as excess‐deficiency effects have minimal influence. From the reciprocal lattice, the metrics of possible Bravais lattice types are derived for all crystal systems. The measured lattice parameters achieve a precision of <1%, even for good quality Kikuchi diffraction patterns of 400 × 300 pixels. This band‐edge detection approach has been validated on several hundred experimental diffraction patterns from phases of different symmetries and random orientations. It produces a systematic lattice parameter offset of up to ±4%, which appears to scale with the mean atomic number or the backscatter coefficient. [ABSTRACT FROM AUTHOR]

The locally varying tetragonality in martensite grains of a high‑carbon steel (1.2 mass percent C) was resolved by electron backscatter diffraction (EBSD) with a spatial resolution in the order of 100 nm. Compared to spatially integrating X-ray diffraction, which yielded an average tetragonality of c / a = 1.05, the EBSD measurements in the scanning electron microscope allowed to image a local variation of the lattice parameter ratio c / a in the range of 1.02 ≤ c / a ≤ 1.07. The local variation of tetragonality is confirmed by two different EBSD data analysis approaches based on the fitting of simulated to experimental EBSD patterns. The resulting EBSD-based tetragonality maps are pointing to a complex interaction of carbon concentration and local lattice distortions during the formation process of martensitic structures. • Fe-1.2%C martensite tetragonality (c/a ratio) was resolved using EBSD pattern matching. • EBSD pattern matching results are compared to XRD. • EBSD pattern matching provides spatial information about c/a. • c/a of Fe-1.2%C martensite varies significantly in the measured sample area, with an average value close to one acquired with XRD. [ABSTRACT FROM AUTHOR]