1. Photoionization of Multiply Charged Ions at the Advanced Light Source.
- Author
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Schlachter, A. S., Kilcoyne, A. L. D., Aguilar, A., Gharaibeh, M. F., Emmons, E. D., Scully, S. W. J., Phaneuf, R. A., Müller, A., Schippers, S., Alvarez, I., Cisneros, C., Hinojosa, G., and McLaughlin, B. M.
- Subjects
PHOTOIONIZATION ,PHOTOCHEMISTRY ,ELECTRON impact ionization ,IONS ,PROPERTIES of matter ,ION sources - Abstract
Photoionization of multiply charged ions is studied using the merged-beams technique at the Advanced Light Source. An ion beam is created using a compact 10-GHz all-permanent-magnet ECR ion source and is accelerated with a small accelerator. The ion beam is merged with a photon beam from an undulator to allow interaction over an extended path. Absolute photoionization cross sections have been measured for a variety of ions along both isoelectronic and isonuclear sequences. © 2005 American Institute of Physics [ABSTRACT FROM AUTHOR]
- Published
- 2005
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