1. Electron Attachment to Higher Fullerenes and to Sc3N@C80
- Author
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Sylwia Ptasinska, Paul Scheier, Stephan Denifl, Tilmann D. Märk, Olof Echt, Aleksandar Stamatovic, Michal Stano, P. Sulzer, and Fabio Zappa
- Subjects
Free electron model ,Fullerene ,Autoionization ,Chemistry ,Electron affinity ,Yield (chemistry) ,Physical and Theoretical Chemistry ,Atomic physics ,Resonance (particle physics) ,Higher fullerenes ,Ion - Abstract
We report on attachment of free electrons to fullerenes C(n) (n = 60, 70, 76, 78, 80, 82, 84, 86) and to Sc(3)N@C(80). The attachment cross sections exhibit a strong resonance at 0 eV for all species. The overall shape of the anion yield versus electron energy is quite similar for the higher fullerenes, with a minimum around 1 eV and a maximum which gradually shifts from 6 eV for C(60) to approximately 4 eV for large n. The endohedral Sc(3)N@C(80) exhibits a particularly shallow minimum and a maximum below 4 eV. We model autoionization of the anions with due consideration of the internal energy distributions. The relatively low electron affinity of Sc(3)N@C(80) is reflected in its reduced ion yield at higher attachment energies.
- Published
- 2006
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