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In order to improve the spatial resolution of an optical micro-scanning thermal microscope system, the micro-scanning position must be accurately calibrated. An adaptive calibration method based on image registration and plane coordinate system is proposed. The meaning of calibration is given, and the principle and method of point calibration are introduced in detail and experiments using the real system were done. Different reconstruction methods were applied to reconstruct the visible light image and the real thermal microscope image, and the evaluation scores are given. Results of simulation and real thermal imaging processing show that the method can successfully calibrate the micro-scanning position. The method can significantly improve the oversampled reconstructed image quality, thus enhancing the spatial resolution of the system. This method can also be used in other electro-optical imaging systems. [ABSTRACT FROM AUTHOR]

The Degree of Linear Polarization (DoLP) is a key dimension of information in polarization imaging. The quality of polarization images is greatly affected by imaging equipment and environmental factors. Therefore, an enhancement method for the DoLP image is proposed in this paper. First, a super-resolution reconstruction algorithm based on the Detail Enhancement Guided Image Filter is proposed to solve the problem of mosaicization and pseudo-polarization information caused by the degradation of spatial resolution and super-resolution reconstruction of DoFP imaging. Second, for the problem of rapid degradation of polarization image quality caused by hazy environment, a DoLP enhancement algorithm based on multi-channel difference Signal-to-Noise Ratio is proposed to improve the visual effect of polarization images in different scenes with hazy environment. The method proposed in this paper implements super-resolution reconstruction, demosaicing, pseudo-polarization information removal, and adaptive enhancement of DoLP images in DoFP systems. [ABSTRACT FROM AUTHOR]

Highlights • A new and high precision micro-scanning component design method was proposed. • A thermal microscope imaging system based on an uncooled infrared detector. • Micro-scanning technology is used in thermal microscope imaging systems to improve its spatial resolution. Abstract In order to meet the needs of subtle thermal analysis, We developed a thermal microscope imaging system based on uncooled focal plane detector in 2008. But for more sophisticated observations, the higher spatial resolution of thermal microscope imaging system is needed. Optical micro-scanning technology is one of the effective techniques to solve this problem. It can improve the systems spatial resolution based on existing imaging devices. Early we have developed an optical micro-scanning thermal microscope imaging system. But the system has a large micro-scanning error and requires high accuracy on the mechanical manufacturing and optical processing, which is not conducive to product. In order to reduce the micro-scanning error of developed optical micro-scanning thermal microscope imaging system and improve the spatial resolution of the system, a high precision micro-scanning component design method was proposed. The working principle of optical flat plate rotation micro-scanning is analyzed. The parameters and processing tolerances of micro-scanner are given. The integrated design and processing are realized with the existing uncooled thermal microscope imaging system. Results of standard oversample reconstruction for the real thermal microscope images have shown that the system is designed successfully and achieves higher resolution. It can be applied to high resolution micro-thermal analysis. [ABSTRACT FROM AUTHOR]