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We consider sampling strategies for reducing the radiation dose during image acquisition in scanning-beam microscopies, such as SEM, STEM, and STXM. Our basic assumption is that we may acquire subsampled image data (with some pixels missing) and then inpaint the missing data using a compressed-sensing approach. Our noise model consists of Poisson noise plus random Gaussian noise. We include the possibility of acquiring fully sampled image data, in which case the inpainting approach reduces to a denoising procedure. We use numerical simulations to compare the accuracy of reconstructed images with the “ground truths.” The results generally indicate that, for sufficiently high radiation doses, higher sampling rates achieve greater accuracy, commensurate with the well-established literature. However, for very low radiation doses, where the Poisson noise and/or random Gaussian noise begins to dominate, then our results indicate that subsampling/inpainting can result in smaller reconstruction errors. We also present an information-theoretic analysis, which allows us to quantify the amount of information gained through the different sampling strategies and enables some broader discussion of the main results. [ABSTRACT FROM AUTHOR]

In the realm of signal and image denoising and reconstruction, ℓ1 regularization techniques have generated a great deal of attention with a multitude of variants. In this work, we demonstrate that the ℓ1 formulation can sometimes result in undesirable artifacts that are inconsistent with desired sparsity promoting ℓ0 properties that the ℓ1 formulation is intended to approximate. With this as our motivation, we develop a multiscale higher-order total variation (MHOTV) approach, which we show is related to the use of multiscale Daubechies wavelets. The relationship of higher-order regularization methods with wavelets, which we believe has generally gone unrecognized, is shown to hold in several numerical results, although notable improvements are seen with our approach over both wavelets and classical HOTV. These results are presented for 1D signals and 2D images, and we include several examples that highlight the potential of our approach for improving two- and three-dimensional electron microscopy imaging. In the development approach, we construct the tools necessary for MHOTV computations to be performed efficiently, via operator decomposition and alternatively converting the problem into Fourier space. [ABSTRACT FROM AUTHOR]