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Quantum Hall and magneto-photoluminescence (magneto-PL) measurements are simultaneously performed on a GaAs quantum well to establish a detailed correlation between magneto-optical and magneto-transport properties of charge carriers. The longitudinal/transverse magneto-resistances under dark and illuminated conditions provide insight into an electron–electron interaction that pushes charge carriers toward the heterointerfaces. It is observed that photogenerated holes screen this interaction potential and annihilate the accumulation of electrons in the ground energy state. In this process, carriers from excited states are redistributed in lower energy sub-bands, which affect the quantum scattering time of carriers. In particular, the scattering time associated with an excited state is significantly reduced as compared to the ground state. Under this condition, the redistribution of charges among Landau states is probed by the magneto-PL measurements. Also, magneto-PL spectroscopy is used to estimate recombination time, carrier occupancy in Landau states, and Fermi energy as a function of a magnetic field. In our previous work [J. Lumin. 206, 342 (2019)], it was demonstrated that a variation in the strength/orientation of a magnetic field can control the recombination and separation of charges, where the PL spectra under a parallel magnetic field help to acquire anisotropic properties of charge carriers. Here, a similar method is used to estimate the anisotropic properties of carriers under an external electric field and then correlated with that obtained from quantum Hall measurements during illumination. Furthermore, a new method to record magneto-PL intensity oscillations is described, which can be used to realize magneto-optical properties of carriers without any line-shape fitting procedure. [ABSTRACT FROM AUTHOR]

The effect of the magnetic field on radiative and non-radiative mechanisms of charge carriers in GaAs/AlGaAs quantum wells (QWs) is investigated via quasi-simultaneous magneto-photoluminescence (PL) and magneto-surface photo-voltage (SPV) spectroscopy. At low-temperature, the luminescence intensity of ultra-low disordered GaAs/AlGaAs QWs generally increases under strong magnetic perturbation. Even at relatively high-temperature (100 K), the magnetic field driven enhancement of PL intensity is observed for thick QWs. On the other hand, it is found that the PL intensity of narrow QWs gradually decreases under a strong magnetic field at 100 K. The magnetic field driven enhancement (suppression) of radiative recombination efficiency for wide (narrow) QWs is investigated by considering the oscillator strength, thermal effects, and carrier re-distribution in energy states. Also, the charge carriers which escape from narrow QWs or are captured by interface defects are probed via magneto-SPV measurements. Radiative recombination and thermionic emission of charge carriers, investigated by magneto-PL and magneto-SPV spectroscopy, provide a clear guideline of the critical QW width which would be essential for magnetic field driven high-temperature operation of advanced emission based-devices. [ABSTRACT FROM AUTHOR]

The impact of interface defect states on the recombination and transport properties of charges in asymmetric modulation-doped InGaAs/GaAs quantum wells (QWs) is investigated. Three sets of high-mobility InGaAs QW structures are systematically designed and grown by the metal-organic vapor phase epitaxy technique to probe the effect of carrier localization on the electro-optical processes. In these structures, a built-in electric field drifts electrons and holes towards the opposite hetero-junctions of the QW, where their capture/recapture processes are assessed by temperature-dependent photoreflectance, photoluminescence, and photoconductivity measurements. The strength of the electric field in the structures is estimated from the Franz Keldysh oscillations observed in the photoreflectance spectra. The effects of the charge carrier localization at the interfaces lead to a reduction of the net electric field at a low temperature. Given this, the magnetic field is used to re-distribute the charge carriers and help in suppressing the effect of interface defect states, which results in a simultaneous increase in luminescence and photoconductivity signals. The in-plane confinement of charge carriers in QW by the applied magnetic field is therefore used to compensate the localization effects caused due to the built-in electric field. Subsequently, it is proposed that under the presence of large interface defect states, a magnetic field-driven diamagnetic-Landau shift can be used to estimate the fundamental parameters of charge carriers from the magneto-photoconductivity spectra instead of magneto-photoluminescence spectra. The present investigation would be beneficial for the development of high mobility optoelectronic and spin photonic devices in the field of nano-technology. [ABSTRACT FROM AUTHOR]

Williamson-Hall (WH) analysis is a well established method for studying the microstructural properties of epilayers grown on foreign substrates. However, the method becomes inapplicable in specific cases where the structure factor considerations and the presence of anti-phase domains forbid the data acquisition for certain reflections in conventional high-resolution X-ray diffraction (HRXRD) measurements. Here, this limitation is overcome by exploiting the large intensity (25 µW mm−2) and high photon energy (15.5 keV) of the X-ray beam obtained from a synchrotron radiation source. The lateral coherence length, vertical coherence length, tilt and micro-strain of GaAs epilayers grown on Si substrate have been successfully measured using the conventional WH analysis. The microstructure information obtained from the conventional WH analysis based on the data acquired at the synchrotron radiation source is in reasonable agreement with the results obtained from atomic force microscope and surface profiler measurements. Such information cannot be obtained on a laboratory-based HRXRD system where modification of the WH method by involving a set of parallel asymmetric crystallographic planes is found to be essential. However, the information obtained from the modified WH method is along a different crystallographic orientation. [ABSTRACT FROM AUTHOR]

Modified Williamson-Hall (WH) analysis is used to determine the reliable values of the microstructures for Zincblende epilayers grown on non-polar substrates. Systematic high resolution X-ray diffraction (HRXRD) experiments are performed for several skew symmetric reflections which enable an accurate measurement of the values of vertical coherence length (VCL) and microstrain of GaAs epilayers grown on Si. Furthermore, a simple method based on the orientation of Burgers vector is proposed for estimating the ratio of tilt and twist. In this method, the twist can be found easily once tilt is known. It is rather quick and the measured values of twist are very similar to those which are otherwise estimated by acquiring numerous HRXRD scans along with tedious fitting procedures. Presence of 60° mixed dislocations is confirmed from the cross sectional high resolution transmission electron microscope images of GaAs / Si samples. Furthermore, the estimated value of VCL is equivalent to the layer thickness measured by the surface profiler. [ABSTRACT FROM AUTHOR]

The issue of type-II band alignment for InP/GaAs heterostructure is addressed by means of simple layer architecture of ultrathin quantum wells (QWs). From specific signatures of the radiative recombination in type-II QWs especially the cube root dependence of blueshift in the lowest excitonic transition energy on excitation power in photoluminescence measurements indicates that the observed luminescence is originating from spatially separated electrons and holes. Such a blueshift is seen to increase with the QW thickness again confirming a type-II band alignment. A direct evidence of electron confinement in the conduction band of InP is provided by the capacitance voltage measurements. [ABSTRACT FROM AUTHOR]

The growth of epitaxial InSb layers on highly lattice-mismatched semi-insulating GaAs substrates has been achieved via traditional liquid-phase epitaxy. Scanning and transmission electron microscopy show sharp interfaces even at 35 nm resolution. High-resolution x-ray diffraction studies reveal reflections even up to 2θ=153° with distinct layer and substrate peaks, indicating structural coherence. The films grown were n type and the highest electron mobility obtained was 3.96 x 10[sup 4] cm²/Vs at room temperature. The band gap varies from 0.17 to 0.23 eV in the temperature range of 300-10 K and is consistent with the expected variation. These results indicate that the films grown are comparable to those grown by other sophisticated techniques in terms of structural, optical and electrical properties. [ABSTRACT FROM AUTHOR]

The charge carrier distribution profile, carrier dynamics, barrier height and conduction band offset for asymmetric InAs/InxGa1−x As/GaAs dot-in-well (DWELL) structures are evaluated from temperature-dependent electronic transport and spectroscopic measurements. The charge carrier leakages via defects lead to less charge carrier accumulation in the DWELL architecture in comparison with the associated QWs. Furthermore, the differential capacitance–voltage measurements show the resonance of charge carrier escape rate with the ground and excited states of the DWELL structure. The peak of the charge carrier escape rate related to the excited state is almost independent of the temperature while that of the ground state changes significantly with heating. It is explained on the basis of changes in the accumulated carrier density due to carrier localization and nonradiative recombination processes, via defects/dislocations/Auger recombination, which are dominant at moderate and high temperatures, respectively. Furthermore, the obtained values of barrier height and conduction band offsets for asymmetric InAs/InxGa1−x As/GaAs (x = 0.18) DWELL structures are 194 ± 10 meV and 287 ± 10 meV, respectively. Downward transitions from both ground and excited states of quantum dots (QDs) are observed in photoluminescence while upward transitions only to the excited state energy levels of QDs are observed in photoreflectance spectroscopy. This is due to the filling of the ground state energy levels of QDs, which is confirmed by the electron transport measurements. Hence, it is concluded that interband absorption occurs to the excited states, whereas intersubband absorption predominantly takes place from the ground states to the continuum of the QD ensemble. [ABSTRACT FROM AUTHOR]