1. Single-shot X-ray Absorption Spectroscopy at X-ray Free Electron Lasers
- Author
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Harmand, M., Krygier, A.G., Cammarata, Marco, Chollet, M., Lemke, H.T., Zhu, D., Institut de minéralogie, de physique des matériaux et de cosmochimie (IMPMC), Muséum national d'Histoire naturelle (MNHN)-Institut de recherche pour le développement [IRD] : UR206-Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS), Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de recherche pour le développement [IRD] : UR206-Muséum national d'Histoire naturelle (MNHN)-Centre National de la Recherche Scientifique (CNRS), Lawrence Livermore National Laboratory (LLNL), European Synchrotron Radiation Facility (ESRF), Linac Coherent Light Source (LCLS), SLAC National Accelerator Laboratory (SLAC), Stanford University [Stanford]-Stanford University [Stanford], Paul Scherrer Institute (PSI), Institut de Physique de Rennes (IPR), Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Centre National de la Recherche Scientifique (CNRS), Stanford University-Stanford University, Université de Rennes (UR)-Centre National de la Recherche Scientifique (CNRS), and Muséum national d'Histoire naturelle (MNHN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de recherche pour le développement [IRD] : UR206-Centre National de la Recherche Scientifique (CNRS)
- Subjects
X-ray Absorption Spectroscopy ,Free Electron Lasers ,[PHYS]Physics [physics] ,Condensed Matter - Materials Science ,EXAFS ,Physics - Instrumentation and Detectors ,Materials Science (cond-mat.mtrl-sci) ,FOS: Physical sciences ,Instrumentation and Detectors (physics.ins-det) ,[PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det] ,[PHYS.PHYS.PHYS-GEN-PH]Physics [physics]/Physics [physics]/General Physics [physics.gen-ph] ,XANES - Abstract
X-ray Absorption Spectroscopy (XAS) is a widely used X-ray diagnostic method. While synchrotrons have large communities of XAS users, its use on X-Ray Free Electron Lasers (XFEL) facilities has been rather limited. At a first glance, the relatively narrow bandwidth and the highly fluctuating spectral structure of XFEL sources seem to prevent high-quality XAS measurements without accumulating over many shots. Here, we demonstrate for the first time the collection of single-shot XAS spectra on an XFEL, with error bars of only a few percent, over tens of eV. We show how this technique can be extended over wider spectral ranges towards Extended X-ray Absorption Fine Structure (EXAFS) measurements, by concatenating a few tens of single-shot measurements. Such results open indisputable perspectives for future femtosecond time resolved XAS studies, especially for transient processes that can be initiated at low repetition rate., 11 pages, 5 figures
- Published
- 2020