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We report on experiments aimed at the generation and characterization of solid density plasmas at the free-electron laser FLASH in Hamburg. Aluminum samples were irradiated with XUV pulses at 13.5 nm wavelength (92 eV photon energy). The pulses with duration of a few tens of femtoseconds and pulse energy up to 100 µJ are focused to intensities ranging between 1013 and 1017 W/cm2. We investigate the absorption and temporal evolution of the sample under irradiation by use of XUV and optical spectroscopy. We discuss the origin of saturable absorption, radiative decay, bremsstrahlung and atomic and ionic line emission. Our experimental results are in good agreement with simulations. [ABSTRACT FROM PUBLISHER]

Abstract: Pulse intensities greater than 1017 Watt/cm2 were reached at the FLASH soft X-ray laser in Hamburg, Germany, using an off-axis parabolic mirror to focus 15 fs pulses of 5–70 μJ energy at 13.5 nm wavelength to a micron-sized spot. We describe the interaction of such pulses with niobium and vanadium targets and their deuterides. The beam produced craters in the solid targets, and we measured the kinetic energy of ions ejected from these craters. Ions with several keV kinetic energy were observed from craters approaching 5 μm in depth when the sample was at best focus. We also observed the onset of saturation in both ion acceleration and ablation with pulse intensities exceeding 1016 W/cm2, when the highest detected ion energies and the crater depths tend to saturate with increasing intensity. A general difficulty in working with micron and sub-micron focusing optics is finding the exact focus of the beam inside a vacuum chamber. Here we propose a direct method to measure the focal position to a resolution better than the Rayleigh length. The method is based on the correlation between the energies of ejected ions and the physical dimensions of the craters. We find that the focus position can be quickly determined from the ion time-of-flight (TOF) data as the target is scanned through the expected focal region. The method does not require external access to the sample or venting the vacuum chamber. Profile fitting employed to analyze the TOF data can extend resolution beyond the actual scanning step size. [Copyright &y& Elsevier]

Abstract: The FLASH XUV-free electron laser has been used to irradiate solid samples at intensities of the order 1016 Wcm−2 at a wavelength of 13.5nm. The subsequent time integrated XUV emission was observed with a grating spectrometer. The electron temperature inferred from plasma line ratios was in the range 5–8eV with electron density in the range 1021–1022 cm−3. These results are consistent with the saturation of absorption through bleaching of the L-edge by intense photo-absorption reported in an earlier publication. [Copyright &y& Elsevier]

The ablation of solids by high energy femtosecond pulses from an extreme ultraviolet (XUV) free electron laser has been investigated using picosecond optical imaging. The time-resolved measurements are supplemented by an analysis of the permanent structural surface modifications. Compared with femtosecond optical excitation, distinct differences in the material response are found which are attributed to the increased penetration depth of the XUV radiation and the absence of any absorption nonlinearities. [ABSTRACT FROM AUTHOR]

The x-ray intensities made available by x-ray free electron lasers (FEL) open up new x-ray matter interaction channels not accessible with previous sources. We report here on the resonant generation of Ka emission, that is to say the production of copious Ka radiation by tuning the x-ray FEL pulse to photon energies below that of the K edge of a solid aluminum sample. The sequential absorption of multiple photons in the same atom during the 80 fs pulse, with photons creating L-shell holes and then one resonantly exciting a K-shell electron into one of these holes, opens up a channel for the Ka production, as well as the absorption of further photons. We demonstrate rich spectra of such channels, and investigate the emission produced by tuning the FEL energy to the K-L transitions of those highly charged ions that have transition energies below the K edge of the cold material. The spectra are sensitive to x-ray intensity dependent opacity effects, with ions containing L-shell holes readily reabsorbing the Ka radiation. [ABSTRACT FROM AUTHOR]

Abstract: The article presents preliminary investigation results on the near-surface damage produced by single pulses of XUV free-electron laser in the amorphous α-SiO2, the monocrystalline silicon and the epitaxial films of gold. The irradiation was delivered with single pulses of only 25fs at a wavelength of 32.5nm and of energy up to 10μJ. Structural modifications induced by irradiation were characterized by X-ray microdiffraction, as well as by the AFM and optical microscopy. Ablation craters of well-defined edges with smooth interiors and outer embankments surrounding the crater edges were found in the materials. Polycrystalline phases were revealed in Si and Au film samples, in the embankments and in central parts of some craters. In α-SiO2, a diffraction pattern typical of an amorphous material was observed without any traces of irradiation-initiated crystallization. A step-like, complete removal of gold film was evidenced inside craters, with only small gold residues in central part of craters exposed to higher fluences. [Copyright &y& Elsevier]