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The thermoreflectance method, which can measure thermal diffusivity in the cross-plane direction of thin films, mainly has two possible configurations; rear-heat front-detect (RF) and front-heat front-detect (FF) configuration. FF configuration is applicable to a wide variety of thin films including thin films deposited on opaque substrates, but this configuration has some problems in determination of the thermal diffusivity. One of the main problems is the effect of the penetration of pump beam and probe beam in thin film, which affects the initial temperature distribution near the sample's surface after pulse heating. Several studies have tried to analyze the effect but there have been no practical analytical solutions which can solve this problem in FF configuration. In this paper, we propose a new analytical solution which considers the penetration of pump beam and probe beam into thin film, and by applying Fourier expansion analysis which we developed in a previous study to thermoreflectance signals, we have determined the thermal diffusivity of thin film in the thermoreflectance method under FF configuration. We measured platinum thin films with different thickness under both FF and RF configuration and obtained consistent thermal diffusivity values from both configurations. [ABSTRACT FROM AUTHOR]

The flash methods, which are the most popular transient methods for measuring the thermal diffusivity of solid materials, have evolved into ultrafast laser flash methods by using picosecond or nanosecond pulse lasers as a heating source and a thermo-reflectance technique such as high-speed thermometry. In conventional ultrafast laser flash methods, thermal diffusivity is determined by fitting an analytical equation after single pulse heating to observe thermo-reflectance signals, although actual thermo-reflectance signals are observed after periodic pulse heating. This paper presents an exact analytical solution of the temperature response expressed by Fourier series for one-dimensional heat diffusion after periodic pulse heating. These Fourier coefficients are directly related to the Laplace transformation of the temperature response after single pulse heating. The signal observed for a 100 nm thick platinum thin film on a fused quartz substrate was analyzed by this Fourier expansion analysis and fitted by analytical equations with three parameters: heat diffusion time across thin film, the ratio of heat effusion of the substrate to thin film, and the amplitude of the signal over the entire range of pulse interval in the time domain. Robustness in determining the thermal diffusivity of the thin film by the ultrafast laser flash method can be improved by this new analysis approach. [ABSTRACT FROM AUTHOR]