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This review introduces the technique of helium ion microscopy along with some unique applications of this technology in the fields of electronics and biology, as performed at the National Institute of Advanced Industrial Science and Technology, Japan, over the last several years. Observations of large-scale integrated circuits, analyses of low-dielectric-constant films with minimal damage, and assessments of copper metal in insulating films are discussed. The special characteristics of this technique are explained, including low-energy input to the material and minimal secondary electron energy resulting from helium ion irradiation. Applications to electronic materials, such as tuning the electrical conductivity of graphene films by helium ion beam irradiation and the formation of nanopore arrays on graphene films with nanometer-scale control, are presented. The use of helium ion microscopy to examine cellular tissues based on the low damage imparted by the ion beam is also evaluated. [ABSTRACT FROM AUTHOR]

Scanning ion conductance microscopy (SICM) have attracted great attention as one of the most promising candidates for imaging soft and delicate biological samples. In this review, firstly, up to date research on investigating samples' surface properties using SICM are demonstrated. In surface charge part, as the bias is varied, a polarity-dependent ion current and surface-induced rectification can help SICM to create images of surface charge. In dynamics of living cells part, SICM allows both non-labeling and non-contact during the measurement and performs the best smong fluorescent microscopy and AFM in visualizing dynamics of living cells. In surface morphology part, four examples are demonstrated to show SICM's power. Secondly, combinations with mature technology such as scanning electrochemical microscopy (SECM), sub-aperture stitching technology, stimulated emission depletion (STED) microscopy and protein nanopores are present, which achieve the multifunction of SICM. Thirdly, state-of-the-art ways that can improve imaging rate are demonstrated. Finally, a brief future outlook for SICM is discussed. [ABSTRACT FROM AUTHOR]

Scanning ion conductance microscopy has a widespread application in imaging non-conductive substrates, especially biological samples due to its high-resolution and non-contact imaging. In this work, state-of-the-art achievements on exploring samples’ surface properties including surface morphology, sample conductivity and dynamics using scanning ion conductance microscopy are firstly introduced, which confirm that scanning ion conductance microscopy is such a mature technology that realises non-invasive and high-resolution imaging. Then, combinations with scanning electrochemical microscopy and atomic force microscopy are demonstrated, which realise the multifunction of scanning ion conductance microscopy. Furthermore, improvements that can help enhance the imaging rate are presented. Finally, the future direction of scanning ion conductance microscopy is discussed. [ABSTRACT FROM AUTHOR]