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1. Bias-Eliminated Semantic Refinement for Any-Shot Learning.

2. Fault Description Based Attribute Transfer for Zero-Sample Industrial Fault Diagnosis.

3. Dual Attention-Based Encoder–Decoder: A Customized Sequence-to-Sequence Learning for Soft Sensor Development.

4. Transfer Increment for Generalized Zero-Shot Learning.

5. A slow independent component analysis algorithm for time series feature extraction with the concurrent consideration of high-order statistic and slowness.

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