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Context.The Extreme Ultraviolet Imager (EUI) is part of the remote sensing instrument package of the ESA/NASA Solar Orbiter mission that will explore the inner heliosphere and observe the Sun from vantage points close to the Sun and out of the ecliptic. Solar Orbiter will advance the “connection science” between solar activity and the heliosphere.Aims.With EUI we aim to improve our understanding of the structure and dynamics of the solar atmosphere, globally as well as at high resolution, and from high solar latitude perspectives.Methods.The EUI consists of three telescopes, the Full Sun Imager and two High Resolution Imagers, which are optimised to image in Lyman-αand EUV (17.4 nm, 30.4 nm) to provide a coverage from chromosphere up to corona. The EUI is designed to cope with the strong constraints imposed by the Solar Orbiter mission characteristics. Limited telemetry availability is compensated by state-of-the-art image compression, onboard image processing, and event selection. The imposed power limitations and potentially harsh radiation environment necessitate the use of novel CMOS sensors. As the unobstructed field of view of the telescopes needs to protrude through the spacecraft’s heat shield, the apertures have been kept as small as possible, without compromising optical performance. This led to a systematic effort to optimise the throughput of every optical element and the reduction of noise levels in the sensor.Results.In this paper we review the design of the two elements of the EUI instrument: the Optical Bench System and the Common Electronic Box. Particular attention is also given to the onboard software, the intended operations, the ground software, and the foreseen data products.Conclusions.The EUI will bring unique science opportunities thanks to its specific design, its viewpoint, and to the planned synergies with the other Solar Orbiter instruments. In particular, we highlight science opportunities brought by the out-of-ecliptic vantage point of the solar poles, the high-resolution imaging of the high chromosphere and corona, and the connection to the outer corona as observed by coronagraphs.

The Extreme Ultraviolet Imager (EUI) instrument for the Solar Orbiter mission will image the solar corona in the extreme ultraviolet (17.1 nm and 30.4 nm) and in the vacuum ultraviolet (121.6 nm). It is composed of three channels, each one containing a telescope. Two of these channels are high resolution imagers (HRI) at respectively 17.1 nm (HRI-EUV) and 121.6 nm (HRI-Ly∝), each one composed of two off-axis aspherical mirrors. The third channel is a full sun imager (FSI) composed of one single off-axis aspherical mirror and working at 17.1 nm and 30.4 nm alternatively. This paper presents the optical alignment of each telescope. The alignment process involved a set of Optical Ground Support Equipment (OGSE) such as theodolites, laser tracker, visible-light interferometer as well as a 3D Coordinates Measuring Machine (CMM). The mirrors orientation have been measured with respect to reference alignment cubes using theodolites. Their positions with respect to reference pins on the instrument optical bench have been measured using the 3D CMM. The mirrors orientations and positions have been adjusted by shimming of the mirrors mount during the alignment process. After this mechanical alignment, the quality of the wavefront has been checked by interferometric measurements, in an iterative process with the orientation and position adjustment to achieve the required image quality.

The Extreme Ultraviolet Imager (EUI) instrument for the Solar Orbiter mission will image the solar corona in the extreme ultraviolet (17.1 nm and 30.4 nm) and in the vacuum ultraviolet (121.6 nm) spectral ranges. The development of the EUI instrument has been successfully completed with the optical alignment of its three channels’ telescope, the thermal and mechanical environmental verification, the electrical and software validations, and an end-toend on-ground calibration of the two-units’ flight instrument at the operating wavelengths. The instrument has been delivered and installed on the Solar Orbiter spacecraft, which is now undergoing all preparatory activities before launch.

The Extreme Ultraviolet Imager (EUI) instrument is one of the ten scientific instruments on board the Solar Orbiter mission to be launched in October 2018. It will provide full-sun and high-resolution images of the solar corona in the extreme ultraviolet (17.1 nm and 30.4 nm) and in the vacuum ultraviolet (121.6 nm). The validation of the EUI instrument design has been completed with the Assembly, Integration and Test (AIT) of the instrument two-units Qualification Model (QM). Optical, electrical, electro-magnetic compatibility, thermal and mechanical environmental verifications were conducted and are summarized here. The integration and test procedures for the Flight Model (FM) instrument and sub-systems were also verified. Following the Qualification Review, the flight instrument activities were started with the assembly of the flight units. The mechanical and thermal acceptance tests and an end-to-end final calibration in the (E)UV will then be conducted before delivery for integration on the Solar Orbiter Spacecraft by end of 2016.

International audience; The Solar Orbiter mission is composed of ten scientific instruments dedicated to the observation of the Sun's atmosphere and its heliosphere, taking advantage of an out-of ecliptic orbit and at perihelion reaching a proximity close to 0.28 A.U. On board Solar Orbiter, the Extreme Ultraviolet Imager (EUI) will provide full-Sun image sequences of the solar corona in the extreme ultraviolet (17.1 nm and 30.4 nm), and high-resolution image sequences of the solar disk in the extreme ultraviolet (17.1 nm) and in the vacuum ultraviolet (121.6 nm). The EUI concept uses heritage from previous similar extreme ultraviolet instrument. Additional constraints from the specific orbit (thermal and radiation environment, limited telemetry download) however required dedicated technologies to achieve the scientific objectives of the mission. The development phase C of the instrument and its sub-systems has been successfully completed, including thermo-mechanical and electrical design validations with the Structural Thermal Model (STM) and the Engineering Model (EM). The instrument STM and EM units have been integrated on the respective spacecraft models and will undergo the system level tests. In parallel, the Phase D has been started with the sub-system qualifications and the flight parts manufacturing. The next steps of the EUI development will be the instrument Qualification Model (QM) integration and qualification tests. The Flight Model (FM) instrument activities will then follow with the acceptance tests and calibration campaigns.

Solar Orbiter EUI instrument was submitted to a high solar flux to correlate the thermal model of the instrument. EUI, the Extreme Ultraviolet Imager, is developed by a European consortium led by the Centre Spatial de Liege for the Solar Orbiter ESA M-class mission. The solar flux that it shall have to withstand will be as high as 13 solar constants when the spacecraft reaches its 0.28AU perihelion. It is essential to verify the thermal design of the instrument, especially the heat evacuation property and to assess the thermo-mechanical behavior of the instrument when submitted to high thermal load. Therefore, a thermal balance test under 13 solar constants was performed on the first model of EUI, the Structural and Thermal Model. The optical analyses and experiments performed to characterize accurately the thermal and divergence parameters of the flux are presented; the set-up of the test, and the correlation with the thermal model performed to deduce the unknown thermal parameters of the instrument and assess its temperature profile under real flight conditions are also presented.

The Extreme Ultraviolet Imager (EUI) on-board the Solar Orbiter mission will provide image sequences of the solar atmosphere at selected spectral emission lines in the extreme and vacuum ultraviolet. For the two Extreme Ultraviolet (EUV) channels of the EUI instrument, low noise and radiation tolerant detectors with low power consumption and high sensitivity in the 10-40 nm wavelength range are required to achieve the science objectives. In that frame, a dual-gain 10 μm pixel pitch back-thinned 1k x 1k Active Pixel Sensor (APS) CMOS prototype has been tested during the preliminary development phase of the instrument, to validate the pixel design, the expected EUV sensitivity and noise level, and the capability to withstand the mission radiation environment. Taking heritage of this prototype, the detector architecture has been improved and scaled up to the required 3k x 3k array. The dynamic range is increased, the readout architecture enhanced, the power consumption reduced, and the pixel design adapted to the required stitching. The detector packaging has also been customized to fit within the constraints imposed by the camera mechanical, thermal and electrical boundaries. The manufacturing process has also been adapted and back-thinning process improved. Once manufactured and packaged, a batch of sensors will undergo a characterization and calibration campaign to select the best candidates for integration into the instrument qualification and flight cameras. The flight devices, within their cameras, will then be embarked on the EUI instrument, and be the first scientific APSCMOS detectors for EUV observation of the Sun.

International audience; The Extreme Ultraviolet Imager (EUI) on-board the Solar Orbiter mission will provide full-sun and high-resolution image sequences of the solar atmosphere at selected spectral emission lines in the extreme and vacuum ultraviolet. After the breadboarding and prototyping activities that focused on key technologies, the EUI project has completed the design phase and has started the final manufacturing of the instrument and its validation. The EUI instrument has successfully passed its Critical Design Review (CDR). The process validated the detailed design of the Optical Bench unit and of its sub-units (entrance baffles, doors, mirrors, camera, and filter wheel mechanisms), and of the Electronic Box unit. In the same timeframe, the Structural and Thermal Model (STM) test campaign of the two units have been achieved, and allowed to correlate the associated mathematical models. The lessons learned from STM and the detailed design served as input to release the manufacturing of the Qualification Model (QM) and of the Flight Model (FM). The QM will serve to qualify the instrument units and sub-units, in advance of the FM acceptance tests and final onground calibration.

The Extreme Ultraviolet Imager (EUI) onboard Solar Orbiter consists of a suite of two high-resolution imagers (HRI) and one dual-band full Sun imager (FSI) that will provide EUV and Lyman-α images of the solar atmospheric layers above the photosphere. The EUI instrument is based on a set of challenging new technologies allowing to reach the scientific objectives and to cope with the hard space environment of the Solar Orbiter mission. The mechanical concept of the EUI instrument is based on a common structure supporting the HRI and FSI channels, and a separated electronic box. A heat rejection baffle system is used to reduce the Sun heat load and provide a first protection level against the solar disk straylight. The spectral bands are selected by thin filters and multilayer mirror coatings. The detectors are 10μm pitch back illuminated CMOS Active Pixel Sensors (APS), best suited for the EUI science requirements and radiation hardness. This paper presents the EUI instrument concept and its major sub-systems. The current developments of the instrument technologies are also summarized.