1. Soft X-ray resonant magnetic scattering studies on Fe/CoO exchange bias system
- Author
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Radu, Florin, Nefedov, Alexei, Grabis, Johannes, Nowak, Gregor, Bergmann, Andre, and Zabel, Hartmut
- Subjects
- *
X-ray scattering , *ELECTROMAGNETIC induction , *HYSTERESIS loop , *MAGNETISM - Abstract
Abstract: We have used soft X-ray resonant magnetic scattering (XRMS) to search for the presence of an effective ferromagnetic moment belonging to the antiferromagnetic (AF) layer which is in close contact with a ferromagnetic (F) layer. Taking advantage of the element specificity of the XRMS technique, we have measured hysteresis loops of both Fe and CoO layers of a CoO(40Å)/Fe (150Å) exchange bias bilayer. From these measurements we have concluded that the proximity of the F layer induces a magnetic moment in the AF layer. The F moment of the AF layer has two components: one is frozen and does not follow the applied magnetic field and the other one follows in phase the ferromagnetic magnetization of the F layer. The temperature dependence of the F components belonging to the AF layer is shown and discussed. [Copyright &y& Elsevier]
- Published
- 2006
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