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Two-dimensional honeycomb crystals have inspired intense research interest for their novel properties and great potential in electronics and optoelectronics. Here, through molecular beam epitaxy on SrTiO3(001), we report successful epitaxial growth of metal-rich chalcogenide Fe2Te, a honeycomb-structured film that has no direct bulk analogue, under Te-limited growth conditions. The structural morphology and electronic properties of Fe2Te are explored with scanning tunneling microscopy and angle resolved photoemission spectroscopy, which reveal electronic bands cross the Fermi level and nearly flat bands. Moreover, we find a weak interfacial interaction between Fe2Te and the underlying substrates, paving a newly developed alternative avenue for honeycomb-based electronic devices. [ABSTRACT FROM AUTHOR]

It is widely believed that the undoped Mott insulator is crucial to understand the origin of high-TC superconductivity and the complex phase diagram in cuprates. Tetragonal CuO, the simplest structure among cuprates, is regarded as an archetypal model to explore the ground state physics of Mott insulator. Here, we report on the epitaxial growth and surface characterization of tetragonal CuO thin film by combining ozone-assisted molecular beam epitaxy and multi-analytical techniques. In situ scanning tunneling microscopy measurement reveals two sets of Cu2+ square lattices with a reversed contrast of their apparent heights between neighboring domains. A spectroscopy study demonstrates an upper bound of the charge transfer gap as 3.68 eV, and quantitatively agrees with the previous photoemission and x-ray photoelectron results. Our work will deepen the understanding of high-energy electronic structures in parent cuprates. [ABSTRACT FROM AUTHOR]

We investigate the atomic structure and electronic properties of monolayers of copper phthalocyanines (CuPc) deposited on epitaxial graphene substrate. We focus in particular on hexadecafluorophthalocyanine (F16CuPc), using both theoretical and experimental (scanning tunneling microscopy - STM) studies. For the individual CuPc and F16CuPc molecules, we calculated the electronic and optical properties using density functional theory (DFT) and time-dependent DFT and found a red-shift in the absorption peaks of F16CuPc relative to those of CuPc. In F16CuPc, the electronic wavefunctions are more polarized toward the electronegative fluorine atoms and away from the Cu atom at the center of the molecule. When adsorbed on graphene, the molecules lie flat and form closely packed patterns: F16CuPc forms a hexagonal pattern with two well-ordered alternating α and β stripes while CuPc arranges into a square lattice. The competition between molecule-substrate and intermolecular van der Waals interactions plays a crucial role in establishing the molecular patterns leading to tunable electron transfer from graphene to the molecules. This transfer is controlled by the layer thickness of, or the applied voltage on, epitaxial graphene resulting in selective F16CuPc adsorption, as observed in STM experiments. In addition, phthalocyanine adsorption modifies the electronic structure of the underlying graphene substrate introducing intensity smoothing in the range of 2-3 eV below the Dirac point (ED) and a small peak in the density of states at ∼0.4 eV above ED. [ABSTRACT FROM AUTHOR]

Ultrathin Pb films with a thickness of three monolayers (ML) were prepared on α-[formula]Pb/Si(111) (Pb-SIC) substrate by molecular beam epitaxy. Despite significant defect scattering, low temperature scanning tunneling microscopy reveals a high superconducting transition temperature Tc of 6.9 K, compared with the bulk Tc (7.2 K). By applying external magnetic field, magnetic vortices were directly imaged, which demonstrates the robustness of superconductivity. By comparing to nearly free-standing Pb films on graphitized SiC (0001) substrate, we suggest that the higher Tc of 3 ML Pb films on Pb-SIC originates from the combined effects of quantum confinement and substrate-enhanced electron-phonon coupling. [ABSTRACT FROM AUTHOR]

A correction to the article "Crystallinity of Tellurium Capping and Epitaxy of Ferromagnetic Topological Insulator Films on SrTiO3" by Jihwey Park et al. that was published in a 2015 issue is presented.

Thin films of topological insulators are often capped with an insulating layer since topological insulators are known to be fragile to degradation. However, capping can hinder the observation of novel transport properties of the surface states. To understand the influence of capping on the surface states, it is crucial to understand the crystal structure and the atomic arrangement at the interfaces. Here, we use x-ray diffraction to establish the crystal structure of magnetic topological insulator Cr-doped (Bi,Sb)2Te3 (CBST) films grown on SrTiO3 (1 1 1) substrates with and without a Te capping layer. We find that both the film and capping layer are single crystal and that the crystal quality of the film is independent of the presence of the capping layer, but that x-rays cause sublimation of the CBST film, which is prevented by the capping layer. Our findings show that the different transport properties of capped films cannot be attributed to a lower crystal quality but to a more subtle effect such as a different electronic structure at the interface with the capping layer. Our results on the crystal structure and atomic arrangements of the topological heterostructure will enable modelling the electronic structure and design of topological heterostructures. [ABSTRACT FROM AUTHOR]

A correction to the article "Crystallinity of Tellurium Capping and Epitaxy of Ferromagnetic Topological Insulator Films on SrTiO3" by Jihwey Park et al. that was published in a 2015 issue is presented.

Thin films of topological insulators are often capped with an insulating layer since topological insulators are known to be fragile to degradation. However, capping can hinder the observation of novel transport properties of the surface states. To understand the influence of capping on the surface states, it is crucial to understand the crystal structure and the atomic arrangement at the interfaces. Here, we use x-ray diffraction to establish the crystal structure of magnetic topological insulator Cr-doped (Bi,Sb)2Te3 (CBST) films grown on SrTiO3 (1 1 1) substrates with and without a Te capping layer. We find that both the film and capping layer are single crystal and that the crystal quality of the film is independent of the presence of the capping layer, but that x-rays cause sublimation of the CBST film, which is prevented by the capping layer. Our findings show that the different transport properties of capped films cannot be attributed to a lower crystal quality but to a more subtle effect such as a different electronic structure at the interface with the capping layer. Our results on the crystal structure and atomic arrangements of the topological heterostructure will enable modelling the electronic structure and design of topological heterostructures. [ABSTRACT FROM AUTHOR]