1. Planar Edge Schottky Barrier-Tunneling TransistorsUsing Epitaxial Graphene/SiC Junctions.
- Author
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Kunc, Jan, Hu, Yike, Palmer, James, Guo, Zelei, Hankinson, John, Gamal, Salah H., Berger, Claire, and de Heer, Walt A.
- Subjects
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SILICON carbide , *FIELD-effect transistors , *GRAPHENE , *SCHOTTKY barrier , *EPITAXY , *ELECTRON transport - Abstract
A purely planar graphene/SiC fieldeffect transistor is presentedhere. The horizontal current flow over one-dimensional tunneling barrierbetween planar graphene contact and coplanar two-dimensional SiC channelexhibits superior on/off ratio compared to conventional transistorsemploying vertical electron transport. Multilayer epitaxial graphene(MEG) grown on SiC(0001̅) was adopted as the transistor sourceand drain. The channel is formed by the accumulation layer at theinterface of semi-insulating SiC and a surface silicate that formsafter high vacuum high temperature annealing. Electronic bands betweenthe graphene edge and SiC accumulation layer form a thin Schottkybarrier, which is dominated by tunneling at low temperatures. A thermionicemission prevails over tunneling at high temperatures. We show thatneglecting tunneling effectively causes the temperature dependenceof the Schottky barrier height. The channel can support current densitiesup to 35 A/m. [ABSTRACT FROM AUTHOR]
- Published
- 2014
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