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The optical, magnetooptical, and magnetic properties of polycrystalline (FeSi/SiO/Si(100)) and epitaxial FeSi/Si(111) films are investigated by spectral magnetoellipsometry. The dispersion of the complex refractive index of FeSi is measured using multiangle spectral ellipsometry in the range of 250-1000 nm. The dispersion of complex Voigt magnetooptical parameters Q is determined for FeSi and FeSi in the range of 1.6-4.9 eV. The spectral dependence of magnetic circular dichroism for both silicides has revealed a series of resonance peaks. The energies of the detected peaks correspond to interband electron transitions for spin-polarized densities of electron states (DOS) calculated from first principles for bulk FeSi and FeSi crystals. [ABSTRACT FROM AUTHOR]

The technique for interpreting magneto-ellipsometric measurements is proposed. The model of a homogeneous semi-infinite medium for reflecting layered magnetic structures in the presence of the magnetic field in the configuration of the magneto-optical equatorial Kerr effect is considered. Based on the analysis of the Fresnel coefficients with regard to the magneto-optical parameter Q appearing in the off-diagonal elements of the permittivity tensor, the expressions are obtained using which the refraction ( n) and absorption ( k) coefficients, the real ( Q) and imaginary ( Q) parts of the magneto-optical parameter can be found from the ellipsometric (ψ and Δ) and magneto-ellipsometric (ψ + δψ and Δ + δΔ) measurements. The results will allow to measure and analyze the magnetic characteristics such as hysteresis loops and the coercitive force of layered nanostructures using the conventional ellipsometric equipment. [ABSTRACT FROM AUTHOR]