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Your search keyword '"Clement, J.M."' showing total 2 results
Start Over Author "Clement, J.M." Topic electronics
2 results on '"Clement, J.M."'

1. Behavior of TPC's in a high particle flux environment

Author

Etkin, A., Eiseman, S.E., Foley, K.J., Hackenburg, R.W., Longacre, R.S., Love, W.A., Morris, T.W., Platner, E.D., Saulys, A.C., Lindenbaum, S.J., Chan, C.S., Kramer, M.A., Zhao, K.H., Zhu, Y., Hallman, T.J., Madansky, L., Ahmad, S., Bonner, B.E., Buchanan, J.A., Chiou, C.N., Clement, J.M., Mutchler, G.S., and Roberts, J.B.

Subjects
Detectors -- Research, Nuclear track detectors -- Research, Business, Electronics, Electronics and electrical industries
Abstract

A study was done on the performance of Time Projection Chambers (TPC) in a high particle flux environment. Results show small measurements of distortions due to ion loading in the TPC even at very high effective particle fluxes. These findings indicate that TPCs can be used at Relativistic Heavy Ion Collider (RHIC) even at the highest planned luminosity. TPCs were also shown to be excellent detectors for RHIC.

Published
1992

2. Silicon multiplicity detector system for an experiment on the interaction of antiprotons with nuclei at BNL

Author

Ahmad, S., Bonner, B.E., Buchanan, J.A., Clement, J.M., Empl, A., Mutchler, G.S., Toshkov, S., Eiseman, S.E., Etkin, A., Foley, K.J., Hackenburg, R.W., Longacre, R.S., Love, W.A., Morris, T.W., Platner, E.D., Saulys, A.C., Chan, C.S., Kramer, M.A., Lindenbaum, S.J., Hallman, T.J., Madansky, L., and Peaslee, D. C.

Subjects
Annihilation reactions -- Research, Nuclear reactions -- Research, Business, Electronics, Electronics and electrical industries
Abstract

A Large Angle Multiplicity Detector (LAMD) system composed of 240 ion implanted silicon photodiodes arranged in 12 pad arrays was developed to measure the charged particle multiplicity distributions from the energetic antiproton beam. The design and performance of the LAMD system were evaluated using extensive bench tests. Results show that the system can accurately measure multiplicity distributions.

Published
1992

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