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Your search keyword '"The Aerospace Corp. (THE AEROSPACE CORP.)"' showing total 2 results
Start Over Author "The Aerospace Corp. (THE AEROSPACE CORP.)" Topic electronic engineering
2 results on '"The Aerospace Corp. (THE AEROSPACE CORP.)"'

1. Radiation effects in a fixed-point digital signal processor

Author

R. Koga, Raoul Velazco, A. Bofill, S.H. Crain, M.T. Alvarez, P. Yu, The Aerospace Corp. (THE AEROSPACE CORP.), The Aerospace Corporation, Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), INTA (INTA), INTA, Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), and Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)

Subjects
Digital signal processor, Engineering, single-event-upset, testing, DSP, fixed-point-digital-signal-processor, Fixed point, Radiation, 01 natural sciences, Texas-Instruments, 0103 physical sciences, Electronic engineering, Hardware_ARITHMETICANDLOGICSTRUCTURES, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Fixed-point arithmetic, Digital signal processing, 010308 nuclear & particles physics, business.industry, single-event-snapback, radiation-effects, Snapback, 13. Climate action, Single event upset, Absorbed dose, PACS 85.42, floating-point-DSPs, business, total-ionizing-dose-effects
Abstract

Radiation effects in a fixed-point digital signal processor (DSP) from Texas Instruments were studied. Single event upset, single event snapback and total ionizing dose effects were observed and some comparisons to other studies of floating-point DSPs are made.

Published
1999

2. SEU-hardened storage cell validation using a pulsed laser

Author

Steven C. Moss, Michael Nicolaidis, T. Calin, Raoul Velazco, V.T. Tran, R. Koga, Stephen LaLumondiere, Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), The Aerospace Corp. (THE AEROSPACE CORP.), The Aerospace Corporation, Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), and Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)

Subjects
Pulsed laser, Nuclear and High Energy Physics, single-event-upset, Materials science, Nuclear engineering, pulsed-laser-testing, Hardware_PERFORMANCEANDRELIABILITY, latch-up, 01 natural sciences, Upset, law.invention, validation, law, Storage cell, 0103 physical sciences, Electronic engineering, Electrical and Electronic Engineering, SEU-hardening, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 010302 applied physics, 010308 nuclear & particles physics, Semiconductor device, Laser, Chip, Nuclear Energy and Engineering, Single event upset, storage-cell, PACS 85.42, Node (circuits)
Abstract

Laser tests performed on a prototype chip to validate new SEU-hardened storage cell designs revealed unexpected latch-up and single-event upset phenomena. The investigations that identified their location show the existence of a topology-dependent dual node upset mechanism. Design solutions are suggested to avoid its occurrence.

Published
1996

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