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Constant-Phase Elements (CPE) are often used to fit impedance data arising from a broad range of experimental systems. Four approaches were used to interpret CPE parameters associated with the impedance response of human skin and two metal oxides in terms of characteristic frequencies and film thickness. The values obtained with each approach were compared against independent measurements. The power-law model developed recently by Hirschorn et al. provided the most reliable interpretation for systems with a normal distribution of properties. Readers are cautioned that the CPE parameter Q does not provide an accurate value for capacitance, even when the CPE exponent α is greater than 0.9. [ABSTRACT FROM AUTHOR]

Numerical methods were used to calculate the influence of geometry-induced current and potential distributions on the impedance response of a blocking disk electrode with a local constant-phase element behavior. While the calculated global impedance is purely capacitive, the local impedance has high-frequency inductive loops that were observed in experiments conducted on a stainless steel electrode in 0.05 M NaCI + 0.005 M Na2SO4 electrolyte. The calculated global impedance responses are in good agreement with experimental results obtained using both the steel electrode and a glassy-carbon disk in KCI electrolytes of differing concentrations. The computed local and both local and global ohmic impedances are shown to provide insight into the frequency dispersion associated with the geometry of disk electrodes. [ABSTRACT FROM AUTHOR]

Abstract: Two different mathematical formulas for estimating effective capacitance from Constant-Phase-Element (CPE) parameters, taken from the literature, are associated unambiguously with either surface or normal time-constant distributions. Application to different systems are used to illustrate the importance of using the correct formula that corresponds to a given type of distribution. Experiments and simulations are used to show that the effective capacitance obtained for a normal distribution yields correct values for the film thickness under conditions where the local resistivity does not vary significantly. When the local resistivity varies considerably over the thickness of a film, the experimental frequency range may preclude observation of the capacitance contribution of a portion of the film, resulting in under prediction of the film thickness. [Copyright &y& Elsevier]