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A new computational method for characterizing the relationship between surface crystallography and electrical conductivity in anisotropic materials with low frequency electromagnetic techniques is presented. The method is discussed from the standpoint of characterizing the orientation of a single grain, as well as characterizing statistical information about grain ensembles in the microstructure. Large-area electron backscatter diffraction (EBSD) data was obtained and used in conjunction with a synthetic aperture approach to simulate the eddy current response of beta annealed Ti-6Al-4V. Experimental eddy current results are compared to the computed eddy current approximations based on electron backscatter diffraction (EBSD) data, demonstrating good agreement. The detectability of notches in the presence of noise from microstructure is analyzed with the described simulation method and advantages and limitations of this method are discussed relative to other NDE techniques for such analysis. [ABSTRACT FROM AUTHOR]

The shot peening conditions of a nickel-based engine-grade material were evaluated using a novel eddy current measurement technique. With this technique, the shift of a resonant frequency was found to be dependent on variables which also affect conventional eddy current testing. The cable effect is another important variable, which is often neglected in a routine eddy current testing, is also discussed. Experimental results showed that at high frequencies, the shot peening conditions were easily distinguishable using this frequency shift technique. © 2007 American Institute of Physics [ABSTRACT FROM AUTHOR]