1. Infrared 45° reflectometry of Li doped ZnO films
- Author
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E. A. Kafadaryan, Abdelmounaime Faouzi Zerrouk, E. S. Vardanyan, E. Kh. Goulanian, Ruben K. Hovsepyan, A. G. Hayrapetyan, A. L. Manukyan, and S. I. Petrosyan
- Subjects
Electron mobility ,Materials science ,business.industry ,Phonon ,Doping ,Wide-bandgap semiconductor ,Analytical chemistry ,General Physics and Astronomy ,Brillouin zone ,Sapphire ,Optoelectronics ,Charge carrier ,business ,Wurtzite crystal structure - Abstract
Lithium doped (0–10 at. % Li) ZnO films were grown in the wurtzite structure on sapphire (001) substrates and investigated in the 200–1200 cm−1 frequency range at 300 K by far-infrared reflectivity spectroscopy using polarized oblique (45°) incidence. This technique has enabled us to determine the longitudinal optical phonon frequency E1(LO) at 576 cm−1 of the fundamental lattice vibration at the center of the Brillouin zone, as well as to investigate the LO phonon-plasmon coupling in the low carrier density (N⩽1018 cm−3) ZnO films. The energy shift and halfwidth broadening of the LO phonon band in comparison with the uncoupled mode in high-ohmic ZnO:0.8 at. % Li (ρdc=0.6×106 Ω cm) film have been analyzed to get the concentration and “optical” mobility of charge carriers in the Li doped ZnO films. The results of optical, x-ray diffraction and dc resistivity measurements are discussed.
- Published
- 2004
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