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We demonstrated the long wavelength (485 nm) lasing of InGaN laser diodes under continuous wave condition at room temperature over 10 mW. Two InGaN laser structures were adapted with different indium composition for InGaN optical confinement layers (OCLs) below quantum wells. The blue shift of electroluminescence (EL) was reduced in InGaN laser diodes grown on 3% In concentration in InGaN OCL compared with 1.5% In concentration in InGaN OCL. The EL peak for laser diode with 3% In concentration in InGaN OCL occurs at longer wavelength for all current levels compared to the laser with 1.5% In concentration in InGaN OCL. In addition, the laterally nonuniform InGaN wells grown on 1.5% In concentration in InGaN OCL was verified by the cross-sectional view of InGaN active layer using high-resolution transmission electron microscopy. [ABSTRACT FROM AUTHOR]

The authors analyzed radiative efficiency of InGaN laser diodes (LDs) emitting at 405 nm. Based on semiconductor rate equations, the radiative efficiency is unambiguously determined by the analysis of electroluminescence characteristics. The radiative efficiency exceeds 70% even far below threshold of ∼3 mA at a high temperature of 80 °C. This highly radiative characteristic is attributed to reduced contribution of nonradiative recombination in LDs with low-dislocation-density active material. It is also found that the radiative efficiency is almost independent of threshold current, indicating that nonradiative recombination is not a major factor which determines lasing threshold in 405 nm emitting InGaN LDs having low dislocation density. [ABSTRACT FROM AUTHOR]

We report stable temperature characteristics of threshold current and output power in InGaN blue laser diodes emitting around 450 nm. The threshold current is changed by <3 mA in operation temperature range from 20 to 80 °C, and even negative characteristic temperature is observed in a certain temperature range. This peculiar temperature characteristic is attributed to originate from unique carrier transport properties of InGaN quantum wells with high In composition, which is deduced from the simulation of carrier density and optical gain. In addition, slope efficiency is also maintained well and wall plug efficiency is even improved as temperature increases. [ABSTRACT FROM AUTHOR]

Pt Schottky rectifier arrays were fabricated on 200-μm-thick, freestanding GaN layers. Even with the reduced dislocation density in these layers (∼10[sup 5] cm[sup -2]) relative to conventional GaN on sapphire (>10[sup 8] cm[sup -2]), rectifiers fabricated on the freestanding GaN show a strong dependence of reverse breakdown on contact diameter. We show that by interconnecting the output of many (∼130) smaller (500 μm×500 μm) rectifiers, we can achieve high total forward output current (161 A at 7.12 V), low forward turn-on voltage of ∼3 V, and maintain the reverse breakdown voltage. The on/off ratio of the rectifier array was ∼8×10[sup 7] at 5 V/-100 V. © 2003 American Institute of Physics. [ABSTRACT FROM AUTHOR]