1. Synchronous measurement of three-dimensional deformations by multicamera digital speckle patterns interferometry
- Author
-
Yonghong Wang, Xingya Gao, Sijin Wu, Lianxiang Yang, Jianfei Sun, and Junrui Li
- Subjects
Surface (mathematics) ,Digital image correlation ,Computer science ,business.industry ,ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION ,General Engineering ,02 engineering and technology ,021001 nanoscience & nanotechnology ,01 natural sciences ,Atomic and Molecular Physics, and Optics ,010309 optics ,Speckle pattern ,symbols.namesake ,Interferometry ,Fourier transform ,Consistency (statistics) ,0103 physical sciences ,symbols ,Calibration ,Computer vision ,Artificial intelligence ,0210 nano-technology ,business - Abstract
We present a spatial phase-shift digital speckle patterns interferometry (SPS-DSPI) system with the capability of measuring three-dimensional (3-D) deformations under a dynamic loading condition simultaneously using multiple cameras. The Fourier transform method is utilized to calculate the phase difference. The consistency of different cameras is achieved using digital image correlation (DIC) technology. Calibration and calculation programs are compiled to make sure each subset on the measuring surface is uniform. SPS-DSPI and DIC techniques are combined to provide a direct measurement of the 3-D deformation of the entire surface area simultaneously. The theory, application result, and validation experiment are presented.
- Published
- 2016