1. Genetic Gain in Wheat Grain Yield and Nitrogen Use Efficiency at Different Nitrogen Levels in an Irrigated Hot Environment.
- Author
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Tahir, Izzat Sidahmed Ali, Elbashier, Elfadil Mohamed Elyayeb, Ibrahim, Mohamed Ahmed Salih, Saad, Abu Sefyan Ibrahim, and Abdalla, Osman Suliman
- Subjects
GRAIN yields ,NITROGEN ,WHEAT yields ,ECOLOGY ,CULTIVARS ,WHEAT - Abstract
Improved nitrogen use-efficient cultivars could be the most economically beneficial and environmentally friendly approach to reduce pollution associated with excessive N fertilization. The performance and genetic gain in grain yield and nitrogen use efficiency (NUE) of a historical set of 12 bread wheat cultivars released for a heat-stressed environment were investigated at four N levels (0 (N
0 ), 43 (N43 ), 86 (N86 ), and 129 (N129 ) kg/ha) for two seasons. Averaged across seasons, increasing N level from N0 to N43, N86 , and N129 resulted in yield increases ranging from 4−45%, 13–69%, and 34–87% at N43, N86 , and N129, respectively. These yield increases were associated with increases in biomass (r = 0.86, P < 0.01). Regressing grain yield of cultivars released during 1960 to 2006 against the year of release showed no trend at N0 and positive nonsignificant trends at N43 ;. however, significant positive trends were found at N86 and N129 with genetic gain rates of 12.65 and 15.76 kg ha−1 year−1 , respectively. This gain was associated with progresses in harvest index (HI) at N43 , N86 , and N129 but not at N0 . On the other hand, during the period from 1960 to 1990, the genetic gain in grain yield at N86 was 24.5 kg ha−1 year−1 . Regressing NUE against the year of release showed significant linear trends at N86 and N129 (R2 = 0.511 and R2 = 0.477, respectively), but not at N43 . The results indicate that breeders improved grain yield and NUE over 46 years under the heat-stressed environment of Sudan although the rate of increase in yield has been slowed down in recent years. Further improvement in NUE might require broadening the genetic diversity and simultaneous evaluation at low and high N levels. [ABSTRACT FROM AUTHOR]- Published
- 2020
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