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In this study, we report the first production of two-dimensionally well-ordered molecular multilayers (i.e., with a well-defined molecular lamellar structure) based on the antiparallel beta-sheet chain conformation in thin films of a brush polypeptide, poly(S-n-hexadecyl-dl-homocysteine) (PHHC), through the use of a simple spin-coating process and the quantitative structural and property analysis of the thin films using a grazing incidence X-ray scattering technique combined with Fourier transform infrared spectroscopy and differential scanning calorimetry. These analyses provide detailed information about the structure and molecular conformation of the self-assembled lamellae in the PHHC thin film, which is not easily obtained using conventional techniques. Moreover, we used the in situ measurements carried out at various temperatures and the data analyses to establish mechanisms for the evolution of the self-assembled lamellar structures in the film and for their melting. In addition, we propose molecular structure models of the PHHC polymer molecules in the thin film at various temperatures.

In this study, a grazing-incidence X-ray scattering (GIXS) formula was derived for lamellar structures formed in thin films supported on substrates, and a comprehensive numerical analysis was performed using the scattering formula. A quantitative analysis was conducted of lamellar structures formed in nanometre-scaled thin films of a brush polymer, poly[oxy(n-decylthiomethylenyl)ethylene], supported on silicon substrates, by GIXS measurements during cooling and subsequent heating, and data analysis was performed using the scattering formula. This analysis provided details (long period, sub-layers and their thicknesses, volume fraction, bristle paracrystal distortion factor, and orientation) of the lamellar structure with varying temperature that are not easily obtained using conventional techniques. Moreover, a molecular structure model and electron density profiles were established.

The crystallization behavior of microbially synthesized poly(3-hydroxybutyrate) was studied in detail using time-resolved small-angle X-ray scattering. This polyester was found to undergo primary crystallization as well as secondary crystallization. In the primary crystallization, the thicknesses of the lamellar crystals were sensitive to the crystallization temperature, but no thickening was observed throughout the entire crystallization at a given temperature. The thickness of the lamellar crystals in the polyester was always larger than that of the amorphous layers. Secondary crystallization favorably occurred during the later stage of isothermal crystallization in competition with the continuous primary crystallization, forming secondary crystals in amorphous regions, in particular in the amorphous layers between the primarily formed lamellar crystal stacks. Compared to the primarily formed lamellar crystals, the secondary crystals had short-range-ordered structures of smaller size, a broader size distribution, and a lower electron density.

In the present study, structural analyses using synchrotron grazing incidence X-ray scattering, specular reflectivity and ellipsometry were performed on thin films of two novel polynorbornene derivatives, chiral poly(norbornene acid methyl ester) and racemic poly(norbornene acid n-butyl ester), which are potential low dielectric constant materials for advanced microelectronic and display applications. These analyses provided important information on the structure, electron density gradient across the film thickness, chain orientation, refractive index and thermal expansion characteristics of the polymers in substrate-supported thin films. The structural characteristics and properties of the thin films depended on the tacticity of the polymer chain and were further influenced by the film thickness and thermal annealing history.