1. The crystal structures of m,o-Ce 3 Pt 4 Sn 6 and Ce 1−x Pt 6 Al 13+2x
- Author
-
Kunio Yubuta, Peter Rogl, Yuta Saiga, Werner Paschinger, Toshiro Takabatake, and Gerald Giester
- Subjects
Materials science ,Resolution (electron density) ,02 engineering and technology ,General Chemistry ,Crystal structure ,010402 general chemistry ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,01 natural sciences ,0104 chemical sciences ,Crystal ,Crystallography ,Electron diffraction ,X-ray crystallography ,General Materials Science ,Orthorhombic crystal system ,0210 nano-technology ,Single crystal ,Monoclinic crystal system - Abstract
The crystal structures of two novel ternary compounds, Ce3Pt4Sn6 and Ce1−xPt6Al13+2x (x = 0.207), have been derived by direct methods from X-ray single crystal data. Whereas Ce1−xPt6Al13+2x is of a new structure type (a = 1.42224(2) nm, c = 0.87367(1) nm, space group P 6 ¯ 2 m ), Ce3Pt4Sn6 was found to crystallize in two different crystal modifications, (i) a monoclinic variant (a = 0.93682(2) nm, b = 0.46145(1) nm, c = 1.40434(3) nm, β = 99.635(1)°, space group P21/m), which is isotypic with the Y3Pt4Ge6-type and (ii) an orthorhombic modification (a = 2.76394(4) nm, b = 0.460588(7) nm, c = 0.93530(1) nm, space group Pnma), which crystallizes with the ordered Pr3Pt4Ge6-type. For the monoclinic arrangement m-Ce3Pt4Sn6 an intrinsically defect growth pattern was found – it grows in two related motifs (opposite directions of pentagonal units) in the ratio of 90% : 10% ensuring a stoichiometric composition. TEM observation directly revealed intrinsic building defects detected by single crystal X-ray diffraction for m-Ce3Pt4Sn6. Diffuse streaks in electron diffraction and inhomogeneous contrasts in a high resolution TEM image indicate the existence of a random stacking sequence between two related motifs.
- Published
- 2016
- Full Text
- View/download PDF