1. Transport and Noise Properties of sub-100-nm Planar Nb Josephson Junctions with Metallic Hf-Ti Barriers for nano-SQUID Applications
- Author
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Morosh, V., Linek, J., Muller, B., Martinez-Perez, M.J., Wolter, S., Weimann, T., Beyer, J., Schurig, T., Kieler, O., Zorin, A.B., Kleiner, R., and Koelle, D.
- Subjects
Condensed Matter::Superconductivity ,Condensed Matter::Mesoscopic Systems and Quantum Hall Effect - Abstract
We analyze electric transport and noise properties at 4.2 K of self-shunted superconductor-normal metal-superconductor (SNS) sandwich-type Josephson junctions, comprising Nb as the superconductor and Hf-Ti as the normal conducting material, with lateral dimensions down to approximately 80 nm. The junctions are fabricated with an optimized multilayer Nb technology based on nanopatterning by electron-beam lithography and chemical-mechanical polishing. The dependence of transport properties on the junction geometry (lateral size and barrier thickness d(Hf-Ti)) is studied, yielding a characteristic voltage V-c up to approximately 100 mu V for the smallest d(Hf-Ti) = 17 nm. The observed small hysteresis in the current-voltage curves of devices with high V-c and large size can be attributed to self-heating of the junctions and fitted with an extended version of the resistively shunted junction model. Measurements of voltage noise of single junctions are consistent with the model including self-heating effects. The potential of our technology for further miniaturization of nanoscale superconducting quantum interference devices and for the improvement of their performance is discussed.
- Published
- 2021