1. Energy-filtered TEM and low-loss EELS of 2D materials
- Author
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Mohn, Michael Johannes, Kaiser, Ute, Koch, Christoph T., European Union (EU), and Horizon 2020
- Subjects
Low-dimensional semiconductors ,DDC 530 / Physics ,Plasmon ,Graphen ,Niederdimensionales System ,Condensed Matter::Materials Science ,Durchstrahlungselektronenmikroskopie ,Heterostructures ,ddc:530 ,Dielectrics ,Dichtefunktionalformalismus ,Graphene ,Electron energy loss spectroscopy ,Elektronen-Energieverlustspektroskopie ,Heterostruktur ,Dielektrische Eigenschaft ,Transmission electron microscopy ,Density functionals - Abstract
In this work, we perform aberration-corrected energy-filtered TEM (EFTEM) and low-loss electron energy-loss spectroscopy (EELS) with two-dimensional (2D) materials. In particular, the carbon K-edge EFTEM signal is analyzed for a monolayer of graphene, and the low-loss EELS spectra of graphene and molybdenum disulfide (MoS���) heterostructures are investigated by the technique of momentum-resolved EELS. With EFTEM in the Cc/Cs-corrected ���SALVE III��� low-voltage transmission electron microscope, we demonstrate lattice contrast in zero-loss, plasmon-loss, and C-K-edge images. Both bright-atom contrast and dark-atom contrast are observed in all three cases, and focus series show that even for the C-K edge, contrast inversions can be caused by a change in the defocus. For an analysis of the image contrast in direct space, all raw EFTEM data are averaged over a large number of unit cells to improve the signal-to-noise-ratio. In the low-loss regime of EELS (0���50 eV), our momentum-resolved experimental data for 2D heterostructures of graphene and MoS��� can be understood by a combination of ab initio simulations and dielectric model calculations. Therefore, the low-loss EELS signals of 2D multilayers and heterostructures are described on the basis of time-dependent density functional theory calculations for the constituent monolayers. Expanding on a layered-electron gas model for graphene, multilayers and heterostructures with MoS��� are eventually modeled by microscopic dielectric calculations that are in good agreement with our experimental EELS data. The necessity of models beyond the layered electron-gas model is demonstrated by calculations for multilayer and bulk MoS���.
- Published
- 2020