1. Thermal readout noise comparison of classical constant bias APS and switching bias APS used in CMOS image sensors
- Author
-
Fernando Morgado-Dias and Luis Miguel Carvalho Freitas
- Subjects
CMOS sensor ,Pixel ,Computer science ,ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION ,Biasing ,Frame rate ,Noise (electronics) ,Surfaces, Coatings and Films ,CMOS ,Hardware and Architecture ,Night vision ,Signal Processing ,Electronic engineering ,Image sensor - Abstract
Modern image sensor devices regularly aim for low-noise and high frame-rate performances, among other key characteristics. However, not all sensor applications require both low-noise and fast output image acquisition as part of the same sensor. In slow object motion, at low-light illumination levels (such as for night vision), low-noise image performance is necessary but only at a reasonable sensor frame rate. This paper presents a theoretical analysis of the most common pixel readout methods in modern imagers, at two distinct operation modes. One mode is the classical active pixel sensor circuit and the other is a more recent operation mode based on a pulsed biasing scheme introduced for specific application cases, in which the sensor speed is not of much concern. From this perspective, this paper aims to compare the theoretical output thermal noise powers of both kinds of readouts in order to identify which readout method is the read option most suitable for low-light vision without the need to employ advanced and complex techniques to obtain a low-noise imager. In addition to the theoretical results, simulation results are presented as well, as a means to validate the theoretical work.
- Published
- 2021