1. A singular-value decomposition approach for ambiguity group determination in analog circuits
- Author
-
Manetti, Stefano and Piccirilli, Maria Cristina
- Subjects
Analog integrated circuits -- Research ,Business ,Computers and office automation industries ,Electronics ,Electronics and electrical industries - Abstract
An efficient approach for ambiguity group determination in low-testability analog linear circuits is presented. It is based on the use of the singular-value decomposition of the testability matrix of the circuit under test, and permits to determine canonical ambiguity groups also in case of circuits of relatively large dimensions. The new approach is characterized by a numerical robustness not present in previous approaches, which give only an estimate of both testability and ambiguity groups. A program implementing the proposed method has been developed by exploiting symbolic analysis techniques. Examples of application of the new approach are considered through the use of this program. Index Terms--Analog system testing, singular-value decomposition (SVD), testability analysis.
- Published
- 2003