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In this work, we present an analytical DC model for the Gallium Nimtide High Electron Mobility Transistor by taking into account the finite width of the two-dimensional electron gas (2DEG) layer. The model predicts the vertical electric field in the device, especially at the interface of AlGaN and GaN layers, electrostatic potential, and energy band diagram are also obtained by the model. The general form of Gauss's law including piezoelectric and spontaneous polarization effect is employed to obtain this model in different regions from top to bottom of the GaN-HEMT. The model solves electrostatic equations in all regions of the device including two narrow regions around the AlGaN/GaN interface with thicknesses of about 3 nm. This model demonstrates how the triangular quantum well is formed around the AlGaN/GaN interface and varies as a function of gate voltages. Using the proposed electrostatic analysis and the treatment proposed by the EPFL HEMT model, the DC current-voltage characteristics are obtained by this model. The results predicted by the model are validated with TCAD simulations and in part with the EPFL HEMT model. The proposed model facilitates the following steps toward obtaining a complete model for small signal and large signal analysis of GaN HEMT. [ABSTRACT FROM AUTHOR]

In this paper, we develop an explicit model to predict the dc electrical behavior in ultrathin surrounding gate junctionless (JL) nanowire field-effect transistors (FETs). The proposed model considers 2-D electrical and geometrical confinements of carrier charge density within few discrete subbands. Combining a parabolic approximation of the Poisson equation, the first-order perturbation theory for the Schrödinger subband energy eigen-values and the Fermi–Dirac statistics for the confined carrier density lead to an explicit solution of the dc characteristic in ultrathin JL devices. Validity of the model has been verified with technology computer-aided design simulations. The results confirm its validity for all regions of operation, i.e., from deep depletion to accumulation and from linear to saturation. This represents an essential step toward analysis of circuits based on JL nanowire devices. [ABSTRACT FROM AUTHOR]

In this work, we propose an analytical model for the intrinsic transcapacitances in ultra-thin gate-all-around junctionless nanowire field effect transistors in the presence of confined energy states of electrons. The validity of the developed model is confirmed from deep depletion to accumulation and from linear to saturation, based on the numerical solution of the Schrödinger equation using Technology Computer Aided Design (TCAD) simulations. This represents an important stage toward AC small signal analysis of junctionless nanowire-based circuits. • Proposing a model to calculate transcapacitances of ultrathin junctionless nanowire • Analytical solution of Poisson-Schrodinger equations including two subbands. • Validation of the model with TCAD simulation for device size of 4 nm to 6 nm. • Steps in C–V characteristics attributed to finite density of states in two subbands. [ABSTRACT FROM AUTHOR]