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Your search keyword '"Zhong, Z."' showing total 1 results
Start Over Author "Zhong, Z." Topic computer simulation Topic x-rays
1 results on '"Zhong, Z."'

1. Multiple scattering effects in strain and composition analysis of nanoislands by grazing incidence x rays.

Author

Richard, M.-I., Favre-Nicolin, V., Renaud, G., Schülli, T. U., Priester, C., Zhong, Z., and Metzger, T.-H.

Subjects
SCREEN-film radiography, X-rays, GRAZING, GERMANIUM, SILICON, NANOSTRUCTURED materials, SCATTERING (Physics), COMPUTER simulation
Abstract

Experiments and numerical simulations based on finite element modeling show that the x-ray intensity scattered by comparatively large nanostructures on a substrate is not simply related to their strain in experiments using either grazing incidence or exit because of multiple scattering effects. However, whatever the nanostructure size, the composition profiles are correctly extracted from grazing incidence multiwavelength anomalous scattering. These effects are illustrated for the structural analysis of Ge dome-shaped islands grown on Si(001). [ABSTRACT FROM AUTHOR]

Published
2009
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