1. Wide Dynamic-Range CMOS RMS Power Detector
- Author
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Quang-Diep Bui, Seong-Sik Myoung, Jae-won Choi, Yao Xi, Sang-Hyun Baek, Jong-Soo Lee, Dae Hyn Kwon, Dongjin Oh, Thomas Byunghak Cho, and Jaehun Lee
- Subjects
Physics ,Radiation ,business.industry ,Amplifier ,020208 electrical & electronic engineering ,Detector ,Electrical engineering ,Schottky diode ,020206 networking & telecommunications ,02 engineering and technology ,Condensed Matter Physics ,CMOS ,Wide dynamic range ,0202 electrical engineering, electronic engineering, information engineering ,Optoelectronics ,Radio frequency ,Electrical and Electronic Engineering ,business ,Electronic circuit ,DC bias - Abstract
This paper presents a wide dynamic range (DR) CMOS root-mean-square power detector with a temperature variation compensation technique in a 28-nm CMOS process. The cascaded gain amplifiers and squaring circuits in the proposed power detector can achieve wide DR with the power level segmented detection method using a switch driver with the help of a modem. A 12-bit current digital-to-analog converter is used to calibrate dc offset in the power detector with 25- $\mu{\hbox{V}}$ steps to improve the accuracy. Measured DR is more than 40 dB from 700 MHz to 4 GHz. A temperature compensation bias circuit improves the performance of the detector with maximum 0.8-dB error over the temperature range $-{\hbox{30 }}^{\circ}{\hbox{C}}\sim {\hbox{90 }}^{\circ}{\hbox{C}}$ . The chip area is 333 $ \mu{\hbox{m}}\times$ 450 $\mu{\hbox{m}}$ and the power consumption is from 5.8 to 11.8 mW depending on the input power using a 1.8-V power supply.
- Published
- 2016
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