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7 results on '"M. Medina-Peregrina"'

1. Reflectivity of VUV-sensitive Silicon Photomultipliers in Liquid Xenon

Author

M. Heffner, Thilo Michel, M. Hughes, F. Vachon, Jean-Francois Pratte, Aleksey E. Bolotnikov, A. Craycraft, R. DeVoe, C. Gingras, C.R. Natzke, A. De St. Croix, T. I. Totev, K. Murray, Gisela Anton, J. C. Nzobadila Ondze, S. Al Kharusi, R. Saldanha, O. Nusair, J. Ringuette, R. Krücken, W. M. Fairbank, M. Worcester, A. Der Mesrobian-Kabakian, N. Massacret, Lorenzo Fabris, David Moore, Wen-Qi Yan, K. Harouaka, R. Gornea, E. Hansen, C. T. Overman, Samuele Sangiorgio, I. Ostrovskiy, H. Rasiwala, M. Tarka, K. S. Kumar, M. Elbeltagi, R. Tsang, A. Larson, John L. Orrell, T. Daniels, E. Caden, F. Retière, Z. Li, Mike Richman, N. Roy, S. Feyzbakhsh, G. Giacomini, M. Murra, G. Li, E. Raguzin, A. Pocar, A. Iverson, Ethan Brown, B. Mong, C. Licciardi, F. Nolet, J. P. Brodsky, A. Tidball, T. McElroy, Shu Li, T. Rossignol, V. A. Belov, R. MacLellan, O. Zeldovich, M. Medina Peregrina, A. Karelin, B. T. Cleveland, K. Odgers, I. Badhrees, Venkatesh Veeraraghavan, D. Fairbank, A. Kuchenkov, M. Wagenpfeil, M. Walent, Giorgio Gratta, Qing Xia, Sergio Ferrara, C. Vivo-Vilches, D. Schulte, Govinda Adhikari, G. S. Ortega, J. Todd, Arun Kumar Soma, C. Weinheimer, T. Brunner, D. S. Leonard, Serge A. Charlebois, A. Odian, L. Darroch, S. Rescia, C. Huhmann, M. J. Dolinski, M. J. Jewell, R. Lindsay, D. Chernyak, L. Althueser, V.N. Stekhanov, M. L. Di Vacri, T. Ziegler, Y. Lan, S. Parent, L. J. Kaufman, A. Gorham, S. X. Wu, P. A. Breur, J. Bane, A. E. Robinson, Eric W. Hoppe, J. Echevers, D. Goeldi, G.J. Ramonnye, Liang Yang, A. Jamil, S. Thibado, C. Richard, M. Chiu, J. Farine, P. Martel-Dion, Guofu Cao, T. Bhatta, J. Nattress, E. Angelico, B. Chana, Douglas H Beck, T. Stiegler, J. Schneider, K. Deslandes, P. C. Rowson, A. House, A. Fieguth, C.A. Hardy, U. Wichoski, S. Viel, G. Gallina, A. Piepke, I. J. Arnquist, P. Gautam, K. G. Leach, R.J. Newby, S. Triambak, F. Spadoni, and C. Chambers

Subjects
Materials science, Physics - Instrumentation and Detectors, APDS, chemistry.chemical_element, FOS: Physical sciences, 01 natural sciences, 7. Clean energy, 030218 nuclear medicine & medical imaging, law.invention, 03 medical and health sciences, 0302 clinical medicine, Optics, Silicon photomultiplier, Xenon, law, 0103 physical sciences, Wafer, Angular resolution, Instrumentation, Mathematical Physics, 010308 nuclear & particles physics, business.industry, Detector, Instrumentation and Detectors (physics.ins-det), Avalanche photodiode, chemistry, Angle of incidence (optics), business
Abstract

Silicon photomultipliers are regarded as a very promising technology for next-generation, cutting-edge detectors for low-background experiments in particle physics. This work presents systematic reflectivity studies of Silicon Photomultipliers (SiPM) and other samples in liquid xenon at vacuum ultraviolet (VUV) wavelengths. A dedicated setup at the University of M\"unster has been used that allows to acquire angle-resolved reflection measurements of various samples immersed in liquid xenon with 0.45{\deg} angular resolution. Four samples are investigated in this work: one Hamamatsu VUV4 SiPM, one FBK VUV-HD SiPM, one FBK wafer sample and one Large-Area Avalanche Photodiode (LA-APD) from EXO-200. The reflectivity is determined to be 25-36% at an angle of incidence of 20{\deg} for the four samples and increases to up to 65% at 70{\deg} for the LA-APD and the FBK samples. The Hamamatsu VUV4 SiPM shows a decline with increasing angle of incidence. The reflectivity results will be incorporated in upcoming light response simulations of the nEXO detector., Comment: 18 pages, 11 figures

Published
2021

2. Event Reconstruction in a Liquid Xenon Time Projection Chamber with an Optically-Open Field Cage

Author

B. Chana, N. Roy, L. Cao, O. Nusair, G. St-Hilaire, Douglas H Beck, R. Krücken, F. Nolet, E. Raguzin, P. A. Breur, T. McElroy, T. Bhatta, L. J. Kaufman, Gerard Visser, D. Goeldi, M. Coon, Eric W. Hoppe, F. Vachon, Z. Li, C. Chambers, Veljko Radeka, Cory T. Overman, L. J. Wen, J. L. Vuilleumier, Samuele Sangiorgio, L. Darroch, P. Gautam, P. Nakarmi, Kaixuan Ni, K. S. Kumar, A. De St. Croix, R. Tsang, Haijun Yang, E. V. Hansen, P. Lv, E. Caden, S. X. Wu, J. Hößl, P. S. Barbeau, Lorenzo Fabris, I. J. Arnquist, R. Gornea, P. C. Rowson, V.N. Stekhanov, X. S. Jiang, C. Licciardi, A. Jamil, A. House, A. Piepke, J. Todd, G. Gallina, S. Thibado, Y. Y. Ding, A. Der Mesrobian-Kabakian, N. Massacret, M. Heffner, R. MacLellan, S. Viel, M. Worcester, Thilo Michel, V. Veeraraghavan, Qing Xia, M. Hughes, G. Li, Sergio Ferrara, S. Al Kharusi, R. DeVoe, A. Pocar, M. Walent, B. G. Lenardo, Arun Kumar Soma, S. Feyzbakhsh, Y. Lan, G. S. Ortega, B. T. Cleveland, K. Deslandes, T. Brunner, A. Kuchenkov, M. Medina-Peregrina, Serge A. Charlebois, F. Retiere, David Moore, M. Chiu, J. P. Brodsky, M. Tarka, F. Edaltafar, T. Wager, K. G. Leach, Wei Wu, R.J. Newby, Qun-Yao Wang, Zhijun Ning, M. Oriunno, Aleksey E. Bolotnikov, K. Murray, Gisela Anton, K. Odgers, B. Mong, M. J. Dolinski, David Leonard, Thomas Koffas, W. M. Fairbank, T. Tsang, T. Stiegler, Jean-Francois Pratte, Angelo Dragone, M. Elbeltagi, John L. Orrell, T. Daniels, Wei Wei, H. Rasiwala, I. Ostrovskiy, Yu-Guang Zhou, S. Rescia, D. Fairbank, Guofu Cao, Mike Richman, O. Njoya, T. I. Totev, A. Iverson, K. Skarpaas Viii, Shu Li, Giorgio Gratta, U. Wichoski, L. Yang, T. Rossignol, M. J. Jewell, A. Craycraft, T. Ziegler, Gabriele Giacomini, J. Echevers, Jens Dilling, C.R. Natzke, I. Badhrees, A. Tidball, M. L. di Vacri, C. Vivo-Vilches, S. Parent, A. Odian, O. Zeldovich, R. Saldanha, M. Wagenpfeil, J. Dalmasson, X.L. Sun, J. B. Zhao, X. F. Wu, A. Larson, Ethan Brown, A. Karelin, J. Farine, V. Belov, and A. Robinson

Subjects
Physics, Nuclear and High Energy Physics, Scintillation, Photon, Time projection chamber, Physics - Instrumentation and Detectors, Field (physics), 010308 nuclear & particles physics, chemistry.chemical_element, FOS: Physical sciences, Instrumentation and Detectors (physics.ins-det), 01 natural sciences, Xenon, chemistry, Double beta decay, Ionization, 0103 physical sciences, Atomic physics, 010306 general physics, Instrumentation, Event reconstruction
Abstract

nEXO is a proposed tonne-scale neutrinoless double beta decay ($0\nu\beta\beta$) experiment using liquid ${}^{136}Xe$ (LXe) in a Time Projection Chamber (TPC) to read out ionization and scintillation signals. Between the field cage and the LXe vessel, a layer of LXe ("skin" LXe) is present, where no ionization signal is collected. Only scintillation photons are detected, owing to the lack of optical barrier around the field cage. In this work, we show that the light originating in the skin LXe region can be used to improve background discrimination by 5% over previous published estimates. This improvement comes from two elements. First, a fraction of the $\gamma$-ray background is removed by identifying light from interactions with an energy deposition in the skin LXe. Second, background from ${}^{222}Rn$ dissolved in the skin LXe can be efficiently rejected by tagging the $\alpha$ decay in the ${}^{214}Bi-{}^{214}Po$ chain in the skin LXe., Comment: 11 pages, 12 figures

Published
2020
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3. Measurements of electron transport in liquid and gas Xenon using a laser-driven photocathode

Author

R. Saldanha, I. Ostrovskiy, D. Kodroff, M. J. Dolinski, S. Rescia, John L. Orrell, T. Daniels, P. Gautam, D. Fairbank, Z. Li, E. Caden, E. V. Hansen, Gerard Visser, J. Watkins, Mike Richman, O. Njoya, R. MacLellan, He-Run Yang, A. Iverson, Triveni Rao, K. Skarpaas Viii, Liang Yang, R. Tsang, Gabriele Giacomini, A. Jamil, Pengpeng Lv, O. Nusair, R. Krücken, Shu Li, J. Echevers, Yu-Guang Zhou, Sergio Ferrara, B. Chana, Y. Lan, M. L. di Vacri, U. Wichoski, T. Wager, J. P. Brodsky, C. Vivo-Vilches, I. J. Arnquist, D. Beck, Thilo Michel, Y-R Yen, T. Tsang, T. Tolba, J. Runge, Yuehe Lin, T. Ziegler, Qun-Yao Wang, P. Nakarmi, Guofu Cao, M. Hughes, Jens Dilling, R. Fontaine, David Leonard, M. Heffner, Angelo Dragone, J. L. Vuilleumier, M. Walent, S. Al Kharusi, I. Badhrees, M. Tarka, Thomas Koffas, W. M. Fairbank, B. G. Lenardo, S. Viel, Arun Kumar Soma, T. Brunner, D. Goeldi, L. J. Kaufman, T. Stiegler, Samuele Sangiorgio, Xuan Wu, K. S. Kumar, S. Parent, M. Elbeltagi, M. Coon, K. G. Leach, David Moore, Wei Wei, Qing Xia, J. Farine, G. S. Ortega, Cory T. Overman, Wei Wu, R.J. Newby, P. C. Rowson, S. X. Wu, S. J. Daugherty, Serge A. Charlebois, A. House, G. St-Hilaire, S. Feyzbakhsh, P. S. Barbeau, A. Robinson, T. Bhatta, V. A. Belov, A.C. Odian, O. Zeldovich, Eric W. Hoppe, A. Piepke, J. Todd, L. Darroch, Y. Y. Ding, M. Oriunno, C. Chambers, A. Pocar, V.N. Stekhanov, B. T. Cleveland, T. Rossignol, A. Kuchenkov, M. J. Jewell, Veljko Radeka, X. S. Jiang, C. Licciardi, G. Gallina, A. Der Mesrobian-Kabakian, V. Veeraraghavan, A. Fucarino, Giorgio Gratta, M. Chiu, K. Murray, Gisela Anton, K. Odgers, E. Raguzin, J. Hossl, R. DeVoe, W. R. Cen, M. Medina-Peregrina, R. Gornea, F. Retiere, B. Mong, M. Wagenpfeil, J. Dalmasson, M. Ward, G. S. Li, X.L. Sun, J. B. Zhao, A. Larson, A. Craycraft, Ethan Brown, C.R. Natzke, A. Karelin, Jean-Francois Pratte, Z. Ning, T. I. Totev, A. De St. Croix, Lorenzo Fabris, N. Roy, L. Cao, F. Nolet, T. McElroy, F. Vachon, L. J. Wen, and Marc Weber

Subjects
Nuclear and High Energy Physics, Physics - Instrumentation and Detectors, Physics::Instrumentation and Detectors, FOS: Physical sciences, chemistry.chemical_element, Electron, medicine.disease_cause, 7. Clean energy, 01 natural sciences, Photocathode, Xenon, Electric field, 0103 physical sciences, medicine, Nuclear Experiment (nucl-ex), 010306 general physics, Instrumentation, Nuclear Experiment, Physics, Argon, 010308 nuclear & particles physics, Instrumentation and Detectors (physics.ins-det), Photoelectric effect, chemistry, Quantum efficiency, High Energy Physics::Experiment, Atomic physics, Ultraviolet
Abstract

Measurements of electron drift properties in liquid and gaseous xenon are reported. The electrons are generated by the photoelectric effect in a semi-transparent gold photocathode driven in transmission mode with a pulsed ultraviolet laser. The charges drift and diffuse in a small chamber at various electric fields and a fixed drift distance of 2.0 cm. At an electric field of 0.5 kV/cm, the measured drift velocities and corresponding temperature coefficients respectively are 1 . 97 ± 0 . 04 m m ∕ μ s and ( − 0 . 69 ± 0 . 05 ) %/K for liquid xenon, and 1 . 42 ± 0 . 03 m m ∕ μ s and ( + 0 . 11 ± 0 . 01 ) %/K for gaseous xenon at 1.5 bar. In addition, we measure longitudinal diffusion coefficients of 25 . 7 ± 4 . 6 cm 2 /s and 149 ± 23 cm 2 /s, for liquid and gas, respectively. The quantum efficiency of the gold photocathode is studied at the photon energy of 4.73 eV in liquid and gaseous xenon, and vacuum. These charge transport properties and the behavior of photocathodes in a xenon environment are important in designing and calibrating future large scale noble liquid detectors.

Published
2019

4. Characterization of the Hamamatsu VUV4 MPPCs for nEXO

Author

P. Giampa, G. Li, D. Kodroff, M. Wagenpfeil, J. Dalmasson, Eric W. Hoppe, N. Roy, David Leonard, J. Blatchford, Thomas Koffas, E. V. Hansen, W. M. Fairbank, P. Gautam, B. T. Cleveland, K. Odgers, L. Cao, Liang Yang, A. Jamil, S. Rescia, T. Stiegler, E. Raguzin, M. Elbeltagi, R. MacLellan, A. Kuchenkov, Arun Kumar Soma, F. Nolet, X.L. Sun, T. Bhatta, D. Fairbank, J. B. Zhao, T. McElroy, A. Larson, Jean-Francois Pratte, B. Mong, F. Vachon, Marc Weber, G. St-Hilaire, P. Margetak, P. Nakarmi, M. Chiu, J. Farine, J. Echevers, C. Chambers, G. Zhang, M. Oriunno, P. C. Rowson, A. Robinson, I. J. Arnquist, S. X. Wu, Douglas H Beck, Qing Xia, U. Wichoski, Ethan Brown, A. House, K. Murray, Y-R Yen, L. Darroch, G. S. Ortega, R. DeVoe, Gisela Anton, T. Ziegler, O. Zeldovich, J. P. Brodsky, T. I. Totev, M. Heffner, Qun-Yao Wang, T. Tolba, W. R. Cen, S. J. Daugherty, A. De St. Croix, G. Gallina, R. Gornea, Serge A. Charlebois, T. Rossignol, Zhijun Ning, M. Tarka, M. J. Jewell, Lorenzo Fabris, J. L. Vuilleumier, M. Walent, John L. Orrell, T. Daniels, R. Tsang, B. G. Lenardo, T. Brunner, K. Skarpaas, P. Lv, V. Veeraraghavan, A. Karelin, J. Todd, Y. Y. Ding, O. Nusair, R. Krücken, Veljko Radeka, Wei Wu, R.J. Newby, M. Hughes, R. Saldanha, S. Al Kharusi, Giorgio Gratta, Martin Ward, He-Run Yang, David Moore, M. Alfaris, S. Feyzbakhsh, A. Craycraft, Y. Ito, L. J. Kaufman, Y. Lan, Yuehe Lin, Z. Li, Samuele Sangiorgio, Wei Wei, F. Retière, K. S. Kumar, J. Hößl, P. S. Barbeau, V. A. Belov, Thilo Michel, J. Kroeger, Xuan Wu, A. Pocar, A. Piepke, V.N. Stekhanov, D. Qiu, M. Coon, Cory T. Overman, T. Tsang, Angelo Dragone, Gabriele Giacomini, Jens Dilling, I. Badhrees, S. Parent, A. Odian, I. Ostrovskiy, Gerard Visser, Mike Richman, O. Njoya, A. Iverson, Shu Li, J. Watkins, M. Medina-Peregrina, X. S. Jiang, C. Licciardi, A. Der Mesrobian-Kabakian, Yu-Guang Zhou, Liangjian Wen, Luca Doria, Guofu Cao, Rejean Fontaine, and M. J. Dolinski

Subjects
010302 applied physics, Physics, Nuclear and High Energy Physics, Scintillation, Physics - Instrumentation and Detectors, 010308 nuclear & particles physics, Analytical chemistry, FOS: Physical sciences, chemistry.chemical_element, Instrumentation and Detectors (physics.ins-det), 01 natural sciences, Xenon, chemistry, 0103 physical sciences, Saturation (graph theory), Astrophysics - Instrumentation and Methods for Astrophysics, Instrumentation and Methods for Astrophysics (astro-ph.IM), Instrumentation, Photon detection, Dark current
Abstract

In this paper we report on the characterization of the Hamamatsu VUV4 (S/N: S13370-6152) Vacuum Ultra-Violet (VUV) sensitive Multi-Pixel Photon Counters (MPPC)s as part of the development of a solution for the detection of liquid xenon scintillation light for the nEXO experiment. Various MPPC features, such as: dark noise, gain, correlated avalanches, direct crosstalk and Photon Detection Efficiency (PDE) were measured in a dedicated setup at TRIUMF. MPPCs were characterized in the range 163 K ≤ T ≤ 233 K . At an over voltage of 3 . 1 ± 0 . 2 V and at T = 163 K we report a number of Correlated Avalanches (CAs) per pulse in the 1 μ s interval following the trigger pulse of 0 . 161 ± 0 . 005 . At the same settings the Dark-Noise (DN) rate is 0 . 137 ± 0 . 002 Hz/mm 2 . Both the number of CAs and the DN rate are within nEXO specifications. The PDE of the Hamamatsu VUV4 was measured for two different devices at T = 233 K for a mean wavelength of 189 ± 7 nm . At 3 . 6 ± 0 . 2 V and 3 . 5 ± 0 . 2 V of over voltage we report a PDE of 13 . 4 ± 2 . 6 % and 11 ± 2 % , corresponding to a saturation PDE of 14 . 8 ± 2 . 8 % and 12 . 2 ± 2 . 3 % , respectively. Both values are well below the 24 % saturation PDE advertised by Hamamatsu. More generally, the second device tested at 3 . 5 ± 0 . 2 V of over voltage is below the nEXO PDE requirement. The first one instead yields a PDE that is marginally close to meeting the nEXO specifications. This suggests that with modest improvements the Hamamatsu VUV4 MPPCs could be considered as an alternative to the FBK-LF Silicon Photo-Multipliers for the final design of the nEXO detector.

Published
2019

5. Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths

Author

E. Caden, S. Rescia, D. Fairbank, G. St-Hilaire, Thilo Michel, A. Craycraft, Jens Dilling, I. Badhrees, A. De St. Croix, X. S. Jiang, C. Licciardi, J. Farine, M. Walent, S. Feyzbakhsh, V. Belov, C.R. Natzke, B. G. Lenardo, A. Robinson, P. Nakarmi, A. Der Mesrobian-Kabakian, T. Brunner, L. Darroch, J. Echevers, Xuan Wu, S. Parent, A. Odian, A. Fucarino, Jean-Francois Pratte, Yu-Guang Zhou, E. Raguzin, T. Rossignol, Z. Li, O. Nusair, J. L. Vuilleumier, R. Krücken, M. Hughes, V. Veeraraghavan, M. J. Jewell, R. Saldanha, T. I. Totev, P. A. Breur, K. Skarpaas, Gerard Visser, S. Al Kharusi, I. Ostrovskiy, B. T. Cleveland, A. Kuchenkov, Liangjian Wen, Luca Doria, Guofu Cao, Samuele Sangiorgio, Wei Wei, K. S. Kumar, Mike Richman, David Moore, O. Njoya, A. Iverson, T. Bhatta, M. Chiu, G. S. Li, Thomas Tsang, Shu Li, Y. Lan, B. Chana, Douglas H Beck, L. Yang, M. Oriunno, J. P. Brodsky, P. S. Barbeau, He-Run Yang, R. DeVoe, K. Murray, J. Watkins, M. Tarka, Gisela Anton, R. Tsang, M. L. di Vacri, K. Odgers, M. J. Dolinski, M. Medina-Peregrina, C. Vivo-Vilches, F. Retiere, U. Wichoski, Sergio Ferrara, O. Zeldovich, K. G. Leach, T. Ziegler, R. Gornea, K. Deslandes, David Leonard, Giorgio Gratta, Thomas Koffas, W. M. Fairbank, Wei Wu, R.J. Newby, P. C. Rowson, T. Stiegler, M. Elbeltagi, Lorenzo Fabris, J. Hobl, A. House, N. Roy, L. Cao, F. Nolet, N. Massacret, T. McElroy, S. X. Wu, F. Vachon, C. Chambers, R. MacLellan, A. Pocar, V.N. Stekhanov, P. Gautam, F. Edaltafar, D. Goeldi, M. Coon, I. J. Arnquist, J. Runge, Cory T. Overman, M. Heffner, S. Viel, G. Gallina, Angelo Dragone, Gabriele Giacomini, P. Lv, A. Piepke, J. Todd, Y. Y. Ding, Veljko Radeka, T. Wager, Qun-Yao Wang, Zhijun Ning, E. V. Hansen, A. Jamil, Arun Kumar Soma, Qing Xia, S. Byrne Mamahit, Ethan Brown, A. Karelin, G. S. Ortega, M. Wagenpfeil, J. Dalmasson, X.L. Sun, J. B. Zhao, A. Larson, Serge A. Charlebois, John L. Orrell, T. Daniels, B. Mong, L. J. Kaufman, and Eric W. Hoppe

Subjects
Nuclear and High Energy Physics, Materials science, Physics - Instrumentation and Detectors, Silicon, chemistry.chemical_element, Photodetector, FOS: Physical sciences, 01 natural sciences, 7. Clean energy, High Energy Physics - Experiment, High Energy Physics - Experiment (hep-ex), Xenon, Silicon photomultiplier, 0103 physical sciences, Wafer, Electrical and Electronic Engineering, 010308 nuclear & particles physics, business.industry, Instrumentation and Detectors (physics.ins-det), Nuclear Energy and Engineering, chemistry, Optoelectronics, Diffuse reflection, Photonics, business, Refractive index
Abstract

Characterization of the vacuum ultraviolet (VUV) reflectance of silicon photomultipliers (SiPMs) is important for large-scale SiPM-based photodetector systems. We report the angular dependence of the specular reflectance in a vacuum of SiPMs manufactured by Fondazionc Bruno Kessler (FBK) and Hamamatsu Photonics K.K. (HPK) over wavelengths ranging from 120 nm to 280 nm. Refractive index and extinction coefficient of the thin silicon-dioxide film deposited on the surface of the FBK SiPMs are derived from reflectance data of a FBK silicon wafer with the same deposited oxide film as SiPMs. The diffuse reflectance of SiPMs is also measured at 193 nm. We use the VUV spectral dependence of the optical constants to predict the reflectance of the FBK silicon wafer and FBK SiPMs in liquid xenon.

Published
2019
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6. Simulation of charge readout with segmented tiles in nEXO

Author

F. Retière, M. Medina-Peregrina, Venkatesh Veeraraghavan, J. Hößl, Gerard Visser, J. L. Vuilleumier, L. Darroch, M. Chiu, J. Watkins, V. A. Belov, Yang Haibo, A. De St. Croix, V. Radeka, D. Fairbank, T. McElroy, T. Bhatta, A. Pocar, D. S. Leonard, J. Echevers, E. Caden, A. Craycraft, R. DeVoe, Lorenzo Fabris, C. T. Overman, E. Raguzin, C. Vivo-Vilches, Qing Xia, M. J. Jewell, Xiaoyang Sun, R. Gornea, J. Dalmasson, S. Feyzbakhsh, P. Gautam, G. S. Ortega, A. Piepke, I. Ostrovskiy, P. Lv, M. Hughes, Thilo Michel, T. Ziegler, C.R. Natzke, Z. Ning, Xuan Wu, F. Vachon, Sergio Ferrara, Serge A. Charlebois, S. X. Wu, V.N. Stekhanov, M. Walent, S. Al Kharusi, J. B. Zhao, A. Larson, A. Der Mesrobian-Kabakian, A. E. Robinson, Mike Richman, B. G. Lenardo, T. Brunner, A. Fucarino, David Moore, N. Roy, L. Cao, F. Nolet, J. Todd, M. Heffner, D. Kodroff, T. Tolba, Jean-Francois Pratte, M. Oriunno, John L. Orrell, T. Daniels, B. Mong, Rejean Fontaine, Ethan Brown, Qian Wang, Y. Lan, K. Murray, G. Giacomini, T. Stiegler, O. Njoya, A. Iverson, K. Skarpaas Viii, Thomas Tsang, R. Saldanha, Shu Li, Y. Y. Ding, Z. Li, Gisela Anton, O. Zeldovich, Marc Weber, E. Hansen, A. Karelin, O. Nusair, R. Krücken, Jens Dilling, R. MacLellan, B. Chana, Giorgio Gratta, P. S. Barbeau, Yumei Zhou, I. Badhrees, R. Tsang, Martin Ward, T. I. Totev, D. Goeldi, M. Coon, Liangjian Wen, Douglas H Beck, Guofu Cao, Angelo Dragone, W. R. Cen, S. J. Daugherty, Thomas Koffas, Xiaoshan Jiang, W. M. Fairbank, M. Elbeltagi, Y-R Yen, S. Rescia, M. J. Dolinski, A. Odian, S. Parent, J. Runge, J. P. Brodsky, P. Nakarmi, U. Wichoski, S. Viel, C. Licciardi, G. Gallina, T. Rossignol, M. L. Di Vacri, L. J. Kaufman, Eric W. Hoppe, Liang Yang, A. Jamil, Arun Kumar Soma, Yuehe Lin, Samuele Sangiorgio, Wei Wei, K. S. Kumar, J. Farine, I. J. Arnquist, K. G. Leach, G. St-Hilaire, Wei Wu, R.J. Newby, P. C. Rowson, A. House, M. Tarka, G. Li, B. T. Cleveland, K. Odgers, A. Kuchenkov, M. Wagenpfeil, and C. Chambers

Subjects
Physics, Physics - Instrumentation and Detectors, Time projection chamber, 010308 nuclear & particles physics, Detector, chemistry.chemical_element, FOS: Physical sciences, Charge (physics), Instrumentation and Detectors (physics.ins-det), 01 natural sciences, 030218 nuclear medicine & medical imaging, Anode, Nuclear physics, 03 medical and health sciences, 0302 clinical medicine, Xenon, chemistry, Double beta decay, 0103 physical sciences, Beta (velocity), Sensitivity (control systems), Nuclear Experiment (nucl-ex), Nuclear Experiment, Instrumentation, Mathematical Physics
Abstract

nEXO is a proposed experiment to search for the neutrino-less double beta decay ($0\nu\beta\beta$) of $^{136}$Xe in a tonne-scale liquid xenon time projection chamber (TPC). The nEXO TPC will be equipped with charge collection tiles to form the anode. In this work, the charge reconstruction performance of this anode design is studied with a dedicated simulation package. A multi-variate method and a deep neural network are developed to distinguish simulated $0\nu\beta\beta$ signals from backgrounds arising from trace levels of natural radioactivity in the detector materials. These simulations indicate that the nEXO TPC with charge-collection tiles shows promising capability to discriminate the $0\nu\beta\beta$ signal from backgrounds. The estimated half-life sensitivity for $0\nu\beta\beta$ decay is improved by $\sim$20$~(32)\%$ with the multi-variate~(deep neural network) methods considered here, relative to the sensitivity estimated in the nEXO pre-conceptual design report.

Published
2019
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7. Reflectivity and PDE of VUV4 Hamamatsu SiPMs in Liquid Xenon

Author

Gerard Visser, M. Walent, B. G. Lenardo, T. Brunner, V. Veeraraghavan, T. Bhatta, Giorgio Gratta, F. Edaltafar, T. Rossignol, M. J. Jewell, J. Watkins, P. Nakarmi, Arun Kumar Soma, Ethan Brown, L. Darroch, O. Nusair, R. Krücken, S. X. Wu, David Leonard, J. Blatchford, E. Caden, Thomas Koffas, W. M. Fairbank, T. Stiegler, M. Elbeltagi, L. J. Kaufman, M. Hughes, X. S. Jiang, C. Licciardi, A. Craycraft, Eric W. Hoppe, S. Al Kharusi, A. Karelin, G. Gallina, P. Gautam, R. Saldanha, M. Chiu, J. L. Vuilleumier, T. Wager, A. Der Mesrobian-Kabakian, David Moore, C. Chambers, M. Oriunno, E. V. Hansen, M. Alfaris, M. Wagenpfeil, J. Dalmasson, Sergio Ferrara, R. MacLellan, Qun-Yao Wang, K. Murray, Gabriele Giacomini, I. J. Arnquist, Liang Yang, Y. Lan, U. Wichoski, C.R. Natzke, S. Feyzbakhsh, A. Jamil, Gisela Anton, J. Runge, Zhijun Ning, T. Ziegler, K. G. Leach, R. Tsang, X.L. Sun, J. B. Zhao, M. Heffner, K. Odgers, S. Viel, Wei Wu, R.J. Newby, A. Fucarino, A. Larson, Z. Li, B. Chana, Douglas H Beck, Samuele Sangiorgio, K. S. Kumar, Veljko Radeka, P. C. Rowson, A. House, N. Massacret, Jean-Francois Pratte, P. Lv, J. Todd, Angelo Dragone, B. Mong, Y. Y. Ding, M. Ward, T. I. Totev, G. S. Li, M. L. di Vacri, R. DeVoe, C. Vivo-Vilches, Qing Xia, S. Byrne Mamahit, G. S. Ortega, R. Fontaine, J. Farine, Serge A. Charlebois, John L. Orrell, T. Daniels, V. Belov, A. Robinson, N. Roy, L. Cao, F. Nolet, T. McElroy, F. Vachon, Marc Weber, A. De St. Croix, Lorenzo Fabris, B. T. Cleveland, D. Goeldi, M. Coon, A. Kuchenkov, Cory T. Overman, S. Rescia, D. Fairbank, G. St-Hilaire, J. P. Brodsky, He-Run Yang, A. Piepke, M. Tarka, V.N. Stekhanov, J. Echevers, A. Pocar, O. Zeldovich, Yu-Guang Zhou, Liangjian Wen, Luca Doria, Guofu Cao, Thilo Michel, Wei Wei, I. Ostrovskiy, M. J. Dolinski, E. Raguzin, P. A. Breur, Xuan Wu, Mike Richman, F. Retière, O. Njoya, A. Iverson, M. Medina-Peregrina, J. Hößl, K. Skarpaas Viii, P. S. Barbeau, Thomas Tsang, Shu Li, R. Gornea, Jens Dilling, I. Badhrees, S. Parent, and A. Odian

Subjects
Materials science, Physics - Instrumentation and Detectors, APDS, Physics::Instrumentation and Detectors, Photodetector, chemistry.chemical_element, FOS: Physical sciences, Photodetection, 01 natural sciences, 030218 nuclear medicine & medical imaging, law.invention, High Energy Physics - Experiment, 03 medical and health sciences, High Energy Physics - Experiment (hep-ex), 0302 clinical medicine, Silicon photomultiplier, Optics, Xenon, law, 0103 physical sciences, Specular reflection, Instrumentation, Mathematical Physics, Scintillation, 010308 nuclear & particles physics, business.industry, Instrumentation and Detectors (physics.ins-det), Wavelength, chemistry, business
Abstract

Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE. Little information is currently available about reflectivity and PDE in liquid noble gases, because such measurements are difficult to conduct in a cryogenic environment and at short enough wavelengths. Here we report a measurement of specular reflectivity and relative PDE of Hamamatsu VUV4 silicon photomultipliers (SiPMs) with 50 micrometer micro-cells conducted with xenon scintillation light (~175 nm) in liquid xenon. The specular reflectivity at 15 deg. incidence of three samples of VUV4 SiPMs is found to be 30.4+/-1.4%, 28.6+/-1.3%, and 28.0+/-1.3%, respectively. The PDE at normal incidence differs by +/-8% (standard deviation) among the three devices. The angular dependence of the reflectivity and PDE was also measured for one of the SiPMs. Both the reflectivity and PDE decrease as the angle of incidence increases. This is the first measurement of an angular dependence of PDE and reflectivity of a SiPM in liquid xenon., Comment: 21 pages, 15 figures, 6 tables. As accepted by JINST

Published
2019
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