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3. A programmable probiotic encapsulation system enhances therapeutic delivery in vivo

4. Microporous Oxide-Based Surface-Enhanced Raman Scattering Film for Quadrillionth Detection of Mercury Ion (II)

5. Cytotoxicity and cell imaging of six types of carbon nanodots prepared through carbonization and hydrothermal processing of natural plant materials

6. Metal microparticle – Polymer composites as printable, bio/ecoresorbable conductive inks

7. Prenylated xanthones and biphenyls from Garcinia esculenta with antistaphylococcal activity

8. Circular dichroism property of conjugated gammadion meta-atom integrated on silicon waveguide

9. Hepatotoxicity induced by psoralen and isopsoralen from Fructus Psoraleae: Wistar rats are more vulnerable than ICR mice

10. Imiquimod-induced AMPK activation causes translation attenuation and apoptosis but not autophagy

11. The intrinsic parameter fluctuation on high-κ/metal gate bulk FinFET devices

12. Optimal power consumption design of the amorphous silicon thin-film transistor gate driver circuit for 10.1-in. display panel manufacturing

13. Effects of Thickness of a Low-Temperature Buffer and Impurity Incorporation on the Characteristics of Nitrogen-polar GaN

14. Effects of growth behaviors on chemical and physical properties of sol–gel derived ZnO:Ga films

15. Influences of preferred orientation growth on electrical properties of ZnO:Al films by sol–gel method

16. Improvement of electrical properties of sol–gel derived ZnO:Ga films by infrared heating method

17. Swiemahogins A and B, two novel limonoids from Swietenia mahogani

18. Rate Study of Haloadamantane Reduction by Samarium Diiodide

19. Experimentally effective clean process to C-V characteristic variation reduction of HKMG MOS devices

20. Multiobjective evolutionary approach to silicon solar cell design optimization

21. Drain-induced-barrier lowering and subthreshold swing fluctuations in 16-nm-gate bulk FinFET devices induced by random discrete dopants

23. Upper/lower-side random dopant fluctuation on 16-nm-gate HKMG bulk FinFET

24. Random-work-function-induced characteristic fluctuation in 16-nm-gate bulk and SOI FinFETs

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