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Micro-end-milling is used for the fabrication of complex geometrical features with high precision on a wide variety of materials. One of the main challenges is related to chatter vibrations, which are detrimental to the productivity and overall quality of the manufactured parts. In this article, a novel chatter-detection method based on wavelet coherence functions is proposed to evaluate the stability of the micro-end-milling process. Then, the method is experimentally tested under different cutting conditions. The results show that the wavelet coherence functions of two orthogonal acceleration signals are sensitive enough and applicable for chatter detection. When chatter occurs, the two orthogonal acceleration signals are highly correlated at the chatter frequency, resulting in a sharp increase in the magnitude of the wavelet coherence functions to values approaching unity. [ABSTRACT FROM AUTHOR]

Chatter detection in metal machining is important to ensure good surface quality and avoid damage to the machine tool and workpiece. This paper presents an intelligent chatter detection method in a multi-channel monitoring system comprising vibration signals in three orthogonal directions. The method comprises three main steps: signal processing, feature extraction and selection, and classification. The ensemble empirical mode decomposition (EEMD) is used to decompose the raw signals into a set of intrinsic mode functions (IMFs) that represent different frequency bands. Features extracted from IMFs are ranked using the Fisher discriminant ratio (FDR) to identify the informative IMFs, and those features with higher FDRs are selected and presented to a support vector machine for classification. Single-channel strategies and multi-channel strategies are compared in low immersion milling of titanium alloy Ti6Al4V. The results demonstrate that the two-channel ( Ay , Az ) strategies based on signal processing and feature ranking/selection give the best performance in classification of the stable and unstable tests. [ABSTRACT FROM AUTHOR]