1. Fractality of Nanostructured Semiconductor Films
- Author
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Z.Zh. Zhanabayev and T.Yu. Grevtseva
- Subjects
Materials science ,business.industry ,Scanning tunneling spectroscopy ,Scanning confocal electron microscopy ,Bioengineering ,Nanotechnology ,Scanning gate microscopy ,Spin polarized scanning tunneling microscopy ,Surfaces and Interfaces ,Scanning capacitance microscopy ,Conductive atomic force microscopy ,Condensed Matter Physics ,Surfaces, Coatings and Films ,Scanning probe microscopy ,Mechanics of Materials ,Energy filtered transmission electron microscopy ,Optoelectronics ,business ,Biotechnology - Abstract
We present a model of spatial distribution of electrons, holes, clusters of intrinsic and admixtures (defects of different types) in nanostructured semiconductor thin films. We obtain intermittent, heterogeneous distributions of concentration typical for images of surfaces obtained by scanning tunneling microscopy, atomic-force microscopy and electron microscopy by numerical analyses.[DOI: 10.1380/ejssnt.2007.132]
- Published
- 2007
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