1. Calibration of X-Ray Diffraction Instruments for Residual-Stress Measurement
- Author
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A. A. Shiryaev, V. N. Trofimov, V. V. Karmanov, and S. N. Zvonov
- Subjects
Diffraction ,0209 industrial biotechnology ,Materials science ,Null (radio) ,business.industry ,Plane (geometry) ,Mechanical Engineering ,chemistry.chemical_element ,02 engineering and technology ,Sample (graphics) ,Industrial and Manufacturing Engineering ,Computer Science::Other ,Nickel ,020303 mechanical engineering & transports ,020901 industrial engineering & automation ,Optics ,0203 mechanical engineering ,chemistry ,Residual stress ,X-ray crystallography ,Calibration ,business - Abstract
The deficiencies of existing standard iron and nickel samples for calibration by means of X-ray diffraction are noted. These standards cannot be used in calibration by magnetic noise recording. A new calibration method based on X-ray diffraction is proposed, using plane samples of the material employed in the manufacture of the actual structures. Theoretical analysis provides the basis for the development of null standards in which a plane sample is deformed by pure flexure or in a cantilever-beam configuration.
- Published
- 2019
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