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1. Prediction of the bidirectional reflectance-distribution function from atomic-force and scanning-tunneling microscope measurements of interfacial roughness

Author

William M. Bruno, Dennis G. Neal, Philip E. Burke, William B. Hewitt, James A. Roth, and Randal E. Holmbeck

Subjects
Microscope, Materials science, Opacity, business.industry, Scattering, Materials Science (miscellaneous), Surface finish, Industrial and Manufacturing Engineering, Light scattering, law.invention, symbols.namesake, Optics, law, symbols, Bidirectional reflectance distribution function, Business and International Management, Scanning tunneling microscope, Rayleigh scattering, business
Abstract

Computer codes that are based on Elson’s theory for light scattering by interfacial roughness in multilayer coatings were used to predict the bidirectional reflectance-distribution function (BRDF) of several opaque coatings from surface-roughness profiles measured by either a scanning–tunneling microscope or an atomic-force microscope. The predictions usually agreed with measured BRDF values to within a factor of 2. The coatings consisted of single layers of Ag or Ni and dielectric stacks with up to three layers.

Published
2010

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