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Drop condensation and coalescence is visualized using high-speed Surface Plasmon Resonance (SPR) reflectance microscopy. SPR microscopy is a label-free technique that can characterize thin films (less than 1µm) by detecting the changes in the refractive index of the test medium. The sensing surface is a 50 nm thick gold film on a 2.5 nm thick Ti layer is deposited on a borosilicate substrate. P-polarized monochromatic light (632 nm) is incident on the gold film in a total internal reflection mode. Free electrons in the gold film are excited by the incident light when a resonance condition is met. The result is a decrease in the reflected intensity. Resonance depends upon wavelength, incident angle, and refractive index of prism and test medium. To induce condensation, a water bridge is created between the SPR gold film and an ITO coated glass slide. When the ITO coated slide is heated water evaporates from the bridge and condenses on the gold film. The sequence of images on the process of droplet deposition and drop coalescence are captured at 1500 frames per second. Experiments were conducted at an SPR angle of 44o, which is slightly above the minimum intensity angle for air at 43.8o. Therefore, the brightest and darkest regions correspond to the areas on the gold film covered with bulk water and a very thin film of water, respectively. The thickness of the film is proportional to the intensity of reflected light.

The surface plasmon resonance (SPR) reflectance imaging technique provides a label-free visualization tool to characterize the near-field fluidic transport properties within 100 nm from the solid surface. The key idea is that the SPR reflectance intensity varies with the near-field refractive index (RI) of the test fluid, which in turn depends on the micro- and nano-fluidic scalar properties such as concentrations, temperatures, and phase changes, occurring in the near-field. As essential knowledge to understand and implement the SPR reflectance imaging technique, this paper presents discussions on the basics of surface plasmon polaritons (SPPs), surface plasmon resonance (SPR), setup of the SPR reflectance imaging system, and the SPR reflectance imaging resolution. The second part of the paper elaborates the applications of the SPR imaging sensor technique in characterizing the near-field fingerprints of nanofluidic evaporative self-assembly.

Reliable determination of the complex refractive index (RI) of graphene inherently requires two independent measurement realizations for two independent unknowns of the real (n(G)) and imaginary (k(G)) components, i.e., RI = n(G) + i k(G). Thus, any single set of measurement realization provides only one constraint that is insufficient to uniquely determine the complex RI of graphene. Tandem uses of two independent measurement techniques, namely the surface plasmon resonance (SPR) angle detection and the attenuated total reflection (ATR) intensity measurement, allow for the unique determination of the complex RI of CVD-synthesized graphene. The presently measured graphene RI is determined to be 2.65 + 1.27i for the E-field oscillating parallel to graphene at 634 nm wavelength, with variations for different numbers of L (1, 3 and 5) remaining within +/- 3%. Thus, our demonstration results for the specified wavelength serve as an impetus to suggest the need for two independent measurement techniques in determining both the real and imaginary RI values for graphene. Additional efforts have been made to characterize graphene layers using the density function theory (DFT): this calculation provides RIG = 2.71 +/- 1.41i.

The total thickness of a graphene sample depends upon the number of individually stacked graphene layers. The corresponding surface plasmon resonance (SPR) reflectance alters the SPR angle, depending on the number of graphene layers. Thus, the correlation between the SPR angle shift and the number of graphene layers allows for a nonintrusive, real-time, and reliable counting of graphene layers. A single-layer graphene (SLG) is synthesized by means of chemical vapor deposition, followed by physical transfer to a thin gold film (48 nm) repeatedly, so that multilayer graphene samples with one, three, and five layers can be prepared. Both the measured SPR angles and the entire reflectance curve profiles successfully distinguish the number of graphene layers.