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In this article, we explore the possibility of using spread spectrum time domain reflectometry (SSTDR) for detecting disconnections in a large-scale photovoltaic (PV) array. We discuss the importance, role, and trade-offs of SSTDR resolution, frequency, and attenuation in detecting disconnects in the system. Our results show that if the proper system parameters are chosen, disconnections can be detected in a 1-kV system consisting of twenty-six 60-cell PV panels and located within 1.52 m for the first 22 modules.

This article explains the use of supervised and unsupervised dictionary learning approaches on spread spectrum time domain (SSTDR) data to detect and locate disconnections in a PV array consisting of five panels. The aim is to decompose an SSTDR reflection signature into different components where each component has a physical interpretation, such as noise, environmental effects, and faults. In the unsupervised dictionary learning approach, the decomposed components are inspected to detect and localize faults. The maximum difference between actual and predicted location of the fault is 0.44 m on a system with five panels connected to an SSTDR box with a leader cable of 59.13 m and total length of 67.36 m including the effective length of the panels. In the supervised dictionary learning approach, the dictionary components are used to classify the SSTDR data to their respective fault types. Our results show a 97% accuracy using the supervised learning approach.

The operating efficiency of photovoltaic (PV) plants can be improved if damaged or degraded modules can be detected and identified. Currently, string-level power electronics can detect problems with modules or cabling but not locate them, which would facilitate addressing these issues. Here, we investigate the ability of spread spectrum time domain reflectometry (SSTDR) to both detect and locate/identify damaged cells and modules within a series-connected PV string. We tested the ability of SSTDR to detect and locate single-cell mini-modules and full-sized PV modules, which were intentionally damaged by impacts with a hammer (breaking the glass and damaging the silicon below) or by cutting through some or all busbars. Damage to the glass and silicon of cells was detected and located within a small string of minimodules. Busbar damage was detectable only if an open was created by cutting through all intercell busbars. Physical impact damage to the glass and silicon of a full-sized PV module could be detected, but further development of signal processing is needed to achieve localization of such damaged modules within a string.

Recent advances in design and processing technology have made possible commercialization of polycrystalline (px)-CdTe as a photovoltaic absorber. Grain boundaries (GBs) are the most prominent struc...

Ultra-fast thermal annealing of semiconductor materials using a laser can be revolutionary for short processing times and low manufacturing costs. Here we investigate Cu–In–Se thin films as precursors for CuInSe2 semiconductor absorber layers via laser annealing. The reaction mechanism of laser annealed metal stacks is revealed by measuring ex situ X-ray diffractograms, Raman spectra and composition. It is shown that the formation of CuInSe2 occurs via the formation of CuxSe/InxSey binary phases as in conventional annealing routes, despite the entirely different annealing time scale. Pre-alloying the Cu and In metals prior to laser annealing significantly enhances the selenisation reaction rate. Laser annealing for six seconds approaches a near phase-pure material, which exhibits similar crystalline quality to the reference material annealed for ninety minutes in a tube furnace. The estimated quasi Fermi level splitting deficit for the laser annealed material is only 60 meV lower than the reference sample, which implies a high optoelectronic quality.

Three-dimensional (3D) semimetals have been predicted and demonstrated to have a wide variety of interesting properties associated with their linear energy dispersion. In analogy to two-dimensional (2D) Dirac semimetals, such as graphene, Cd3As2 has shown ultrahigh mobility and large Fermi velocity and has been hypothesized to support plasmons at terahertz frequencies. In this work, we experimentally demonstrate synthesis of high-quality large-area Cd3As2 thin films through thermal evaporation as well as the experimental realization of plasmonic structures consisting of periodic arrays of Cd3As2 stripes. These arrays exhibit sharp resonances at terahertz frequencies with associated quality factors ( Q) as high as ∼3.7 (at 0.82 THz). Such spectrally narrow resonances can be understood on the basis of a long momentum scattering time, which in our films can approach ∼1 ps at room temperature. Moreover, we demonstrate an ultrafast tunable response through excitation of photoinduced carriers in optical pump/terahertz probe experiments. Our results evidence that the intrinsic 3D nature of Cd3As2 might provide for a very robust platform for terahertz plasmonic applications. Moreover, the long momentum scattering time as well as large kinetic inductance in Cd3As2 also holds enormous potential for the redesign of passive elements such as inductors and hence can have a profound impact in the field of RF integrated circuits.

Perovskites based on methylammonium lead halides, CH3NH3PbX3 (X = Cl, Br, I), have emerged as one of the most promising materials in solar cell technology. Although the photovoltaics field has witn...

This paper reports on the modulation of Schottky barrier heights (SBH) on three different orientations of $\beta$-Ga$_2$O$_3$ by insertion of an ultra-thin SiO$_2$ dielectric interlayer at the metal-semiconductor junction, which can potentially lower the Fermi-level pinning (FLP) effect due to metal-induced gap states (MIGS). Pt and Ni metal-semiconductor (MS) and metal-interlayer-semiconductor (MIS) Schottky barrier diodes were fabricated on bulk n-type doped $\beta$-Ga$_2$O$_3$ single crystal substrates along the (010), (-201) and (100) orientations and were characterized by room temperature current-voltage (I-V) and capacitance-voltage (C-V) measurements. Pt MIS diodes exhibited 0.53 eV and 0.37 eV increment in SBH along the (010) and (-201) orientations respectively as compared to their respective MS counterparts. The highest SBH of 1.81 eV was achieved on the (010)-oriented MIS SBD using Pt metal. The MIS SBDs on (100)-oriented substrates exhibited a dramatic increment ($>$1.5$\times$) in SBH as well as reduction in reverse leakage current. The use of thin dielectric interlayers can be an efficient experimental method to modulate SBH of metal/Ga$_2$O$_3$ junctions., Comment: 8 pages, 10 figures, 2 tables

We report on the growth and characterization of metalorganic vapor-phase epitaxy-grown \b{eta}-(AlxGa1-x)2O3/\b{eta}-Ga2O3 modulation-doped heterostructures. Electron channel is realized in the heterostructure by utilizing a delta-doped \b{eta}-(AlxGa1-x)2O3 barrier. Electron channel characteristics are studied using transfer length method, capacitance-voltage and Hall measurements. Hall sheet charge density of 1.06 x 1013 cm-2 and mobility of 111 cm2/Vs is measured at room temperature. Fabricated transistor showed peak current of 22 mA/mm and on-off ratio of 8 x 106. Sheet resistance of 5.3 k{\Omega}/Square is measured at room temperature, which includes contribution from a parallel channel in \b{eta}-(AlxGa1-x)2O3., Comment: 22 pages, 4 figures

We investigate the effects of high-rate and high total doses of 60Co gamma rays on the current–voltage (IV) characteristics of GaN p+n diodes grown by metal-organic chemical vapor phase epitaxy on Ga-face (0001) sapphire and hydride vapor phase epitaxy freestanding GaN substrates. We show that diodes grown on sapphire undergo more permanent changes upon irradiation at doses up to 3900 kGy than those grown on freestanding GaN. By combining diode and circular transfer length method measurements, we show that the p-type contact interface and adjacent p++ Mg-doped layer are sensitive to irradiation. In initial experiments, diodes grown on sapphire exhibited p-type contacts with Schottky characteristics, while those on freestanding GaN were Ohmic. Serendipitously, we identified and subsequently irradiated a freestanding sample with a pre-irradiation spatial gradient of p-contact Schottky vs Ohmic behavior across the die. This sample allowed the root cause of induced change to be identified as differences in the p++ contacting layer. We show that the p-type contact's pre-irradiation Schottky behavior is predictive of diodes' IV characteristics changing significantly upon gamma-ray irradiation. Further, we observe that the IV curves of diodes on freestanding GaN recover fully over several weeks at room temperature to be indistinguishable from pre-irradiation. IV curves from diodes on sapphire do not fully recover; we thus hypothesize that interactions between radiation-induced point defects and threading dislocations affect the evolution of radiation damage.

We correct three labeling errors, one in Fig. 4(a), and the other two in Section 3.2 of the manuscript text [Opt. Mater. Express 9, 826 (2019)10.1364/OME.9.000826].

Laser annealing can reduce the annealing time required to form Cu(In,Ga)(S,Se)2 (CIGSe) thin films for use in thin film photovoltaics to a single second timescale, if not faster. In this work, we use microstructural characterization coupled with modeling of the optical and thermal properties to understand the laser annealing of three types of electrodeposited precursor stacks for the CIGSe parent compound CuInSe2. The precursor films are: stacked elemental layers Cu/In/Se, stacked binary selenides In2Se3/Cu2−xSe, and a single layer of coelectrodeposited Cu–In–Se. Conceptually, these stacks are ordered in terms of decreasing stored chemical and interfacial potential free energy, consideration of which predicts that the formation of large grained CuInSe2 from the stacked elemental layers would be the most exothermic and thus most rapid process. However we find that microstructural details of the electrodeposited films such as void fraction present in the stacked binary selenides dramatically alter the heat and mass flow. Additionally, modeling of the optical absorption within the elemental stacked precursor suggests extremely localized heating at the In/Se interface resulting in significant Se loss. Despite its lower chemical potential energy, the coelectrodeposited CuInSe2 precursor's more uniform optical absorption of near-bandgap light coupled with its compact, low void fraction microstructure of nano-sized grains results in the most optimal recrystallization and compositional homogenization via interdiffusion. Furthermore this annealed layer formed a working device with a short circuit current density of 23 mA cm−2. This combined modeling and experimental investigation underscores the need to consider practical micro- and nanostructure-dependent properties as well as the optical absorption and not simply thermodynamics when designing accelerated two step deposition and annealing processes for compound semiconductors.

Homoepitaxial growth of β-Ga 2O 3 using metalorganic vapor-phase epitaxy (MOVPE) on several different crystal orientations has previously been studied, but growth on the ( 2 ¯ 01 ) plane has remained comparatively unexplored. To investigate this, we grew Si-doped and unintentionally doped (UID) homoepitaxial layers simultaneously on Sn-doped ( 2 ¯ 01 ) and ( 010 ) substrates under conditions optimized for ( 010 ) growth. We report herein on results from current–voltage and capacitance–voltage (IV and CV) and deep level transient spectroscopy (DLTS) characterization of Schottky diodes fabricated on these samples. Devices on ( 010 ) display nearly ideal Schottky diode JV and CV behaviors while for ( 2 ¯ 01 ) evidence of complete depletion of >2 μm thickness, UID epilayers are observed. The ( 2 ¯ 01 ) UID diodes exhibited Mott–Gurney space charge-limited transport and were completely depleted even at zero bias. Doping ( 2 ¯ 01 ) samples heavily with Si was sufficient to overcome background compensation and reproduce near-ideal diode behavior. DLTS data from these doped devices show, in addition to typical negative majority-carrier transients, positive transients with a broad energy distribution, possibly indicating traps on structural defects or surface states. An etch pit analysis under SEM revealed intricate structures of the grown layers. Cross-sectional TEM characterization of a ( 2 ¯ 01 ) sample revealed a high density of structural defects within the epitaxial layer, likely stacking faults. Hypotheses for the origins of the compensation in ( 2 ¯ 01 ) β-Ga 2O 3 homoepitaxial MOVPE growth under ( 010 ) growth conditions are discussed; the most likely explanation is the presence of defect states introduced by the stacking faults visible under TEM.

Spread spectrum time domain reflectometry (SSTDR) has previously been used for detection and location of intermittent faults on live electrical wiring. These intermittent faults can be open circuits, short circuits, or resistive changes, all of which preserve the original shape of the SSTDR correlated waveform. But things are very different when SSTDR encounters a complex impedance discontinuity such as a capacitor or inductor. In this case, the reflection is a function of frequency, changing the shape of the SSTDR signature. In this paper, we will show the SSTDR response to single capacitors and inductors. We will also explore how SSTDR responds to arrays of PV panels (which are capacitive) connected by wires. We will show both simulations and measurements. In some configurations, it is relatively easy to see faults, although algorithms are still under development. In other configurations, little change occurs, which makes it very difficult to create a system for testing for these faults.

Semiconducting TMDs are promising candidates for THz optoelectronic devices with their ultrafast carrier dynamics and large modulation depths stemming from high photo-induced carrier concentration. In this work, we exploit the ultrafast carrier recombination in photoexcited WSe2 thin films for active THz modulation. The THz absorption was modelled as a sum of a free carrier Drude term and a Lorentzian oscillator for excitonic bound carriers. Based on this, we explore a THz modulator based on a metamaterial structure capacitively coupled to a CVD grown WSe2 film. While the THz absorption upon photoexcitation is strong close to the exciton resonance, the modulation response is limited by free carriers.

Linear energy band dispersion in Dirac semimetals has been associated with strong plasmon coupling in terahertz regime. Graphene, in this regard, has been projected to play crucial role in terahertz optoelectronics due to high carrier mobility and conductivity. However, in the realm of quantum materials, a three-dimension analogue of graphene, Cd 3 As 2 , so called 3D semimetal, has been shown to have carrier mobility and fermi-velocity well exceeding that in graphene. We experimentally demonstrate synthesis of high-quality large-area Cd 3 As 2 thin-films and realization of THz plasmonic structures. The structures exhibit quality factor ~5, at frequency of ~0.7 THz, the highest reported to-date at room temperature in any semiconductor or semimetal. Our results evidence that the 3D nature of Cd 3 As 2 provides for a more robust platform for terahertz applications than what is otherwise possible in graphene.

In this work, we report the different effects of CdCl2 treatment on CdTe films deposited by thermal evaporation onto CdS and MgZnO (MZO) buffer layers. The main finding, which is relevant for understanding recent advances in CdTe device efficiency, is that few- ${\mu}$m thick CdTe films deposited on MZO can be induced to completely recrystallize forming a film consisting of grains that span the film thickness and are up to 30 $\mu$m laterally. On CdS buffer layers, the changes in microstructure with Cl treatment are much less pronounced and the final microstructure is less ideal for thin film photovoltaics. We propose a thermodynamic framework for understanding the microstructural changes during CdCl 2 treatment which can assist in understanding the wide range of behaviors observed across the many CdTe thin film solar cell fabrication procedures.

We discuss the optoelectronic property variation between grains and grain boundaries of CdTe polycrystalline thin films using a confocal microscopy system. Single-photon photoluminescence (PL) and time-resolved photoluminescence spectroscopy (PL) is used to map $10 \times 10 \mu \mathrm {m}^{2}$ area at the back surface of CdTe with an optical resolution of 104 nm. TRPL maps show that different grain boundaries have different near-surface lifetimes. Surprisingly, grain-boundaries with high near-surface lifetime are associated with regions of the sample that have low PL yield. This study demonstrates the potential of confocal PL and TRPL mapping to understand carrier lifetime variations in thin films.

One industrially relevant fabrication method for CuInSe2 absorber layers begins with electrodeposition, which is highly resource efficient and easily up-scalable, followed by a high temperature annealing step. Commonly a furnace is used for annealing, although it is possible to reduce the duration of this step by 2–3 orders of magnitude using laser heating. Past work demonstrated that rastering a 1064 nm, continuous wave, neodymium-doped yttrium aluminium garnet laser beam over an electrodeposited precursor film with 1 s dwell time, promoted CuInSe2 formation, grain growth, and gave a photovoltaic device with 1.6% power conversion efficiency. However, this device showed inhomogeneous current collection correlating approximately to the Gaussian flux profile of the laser beam. This work demonstrates how deviations in the incident laser flux on the precursor lead to local temperature variation in the film. The temperature affects the rates of atomic diffusion, grain growth and chemical reactions, with the hottest region having the largest crystallites and a stoichiometric and constant composition through the film depth. Spatially resolved photoluminescence yield shows a positive correlation to the temperature profile caused by the Gaussian flux. It is expected that with a homogeneous laser beam flux, spatial variations in absorber layer properties would be eliminated, leading to uniform device properties.

Despite the many similarities between Cu2ZnSn(S,Se)4 (CZTSSe) and Cu(In,Ga)(S,Se)2 materials and device architecture, open questions remain about the optimal surface preparation steps for CZTSSe absorbers, including whether differences exist for absorber layers deposited by different methods. In this work, we investigate KCN etching and NH4OH treatment as surface preparation methods for the absorber/CdS interface for two-stage processed CZTSSe and co-evaporated CZTSe absorber layers. Ambient-exposed, thus oxidized and contaminated, thin film absorbers are utilized to examine the effectiveness of these surface preparation methods and to elucidate their effects on device performance. Topography and surface potential images simultaneously obtained by Kelvin probe force microscopy (KPFM) show the existence of an overlayer on the ambient-exposed absorbers. Moreover, KPFM results also demonstrate that although NH4OH treatment removes much of the overlayer from the CZTSSe surface, KCN etching removes the overlayer completely. In addition, differences in the deposited CdS layer and depletion region width result depending on the surface preparation method, with the NH4OH-treated solar cells having narrower depletion region. This is reflected in device results in which KCN-etched solar cells outperform their NH4OH-treated counterparts due to increases in external quantum efficiency at long wavelengths and in open circuit voltage. KPFM measurements also demonstrate that grain boundaries (GBs) in the KCN-etched two-stage processed CZTSSe thin films are either negatively charged or neutral. On the other hand, KCN etching makes the surface almost equipotential in the co-evaporated CZTSe thin film by causing disappearance of positively charged GBs that existed before etching.

Photon absorption is a critical process for photovoltaic operation, yet the effect of illumination on semiconductor growth and processing is rarely investigated. In this work we investigate the effect of illumination during the cadmium chloride (CdCl2) annealing treatment of cadmium telluride (CdTe) thin films for photovoltaic applications while keeping the sample temperature constant. Illumination at 808 nm with varying intensity (0, 0.5, 1 and 1.5 W) when incident on CdTe during thermal CdCl2 treatment of CdTe lead to enhancement of grain size and optoelectronic properties of CdTe. However photoassisted etching of the CdTe surface is also observed at illuminations sufficiently low that the sample temperature was barely affected during annealing. Additionally, annealing under high illumination sufficient to drive CdCl2 annealing in the absence of a furnace has no such effect on the CdTe surface. We attempt to reconcile these observations and provide rationale for further experiments.

General rules to reduce models of polycrystalline photovoltaic materials such as amorphous silicon (a-Si), cadmium telluride (CdTe), and Cu(In, Ga)Se 2 (CIGS) to 1D have been sought for decades. However, a key limitation associated with the 1D simulation of thin-film photovoltaics is the absence of grain boundaries (GBs), which are commonly found in polycrystalline solar cells. Depending on the orientation of growth, GBs are categorized as columnar GBs (roughly perpendicular to incident sunlight) and horizontal GBs (perpendicular to incident sunlight). In this work, we investigate whether polycrystalline grain materials can be appropriately treated as an effective medium, using 1D and 2D simulations of CdTe solar cells that are CSS grown and Br:MeOH+CdCl 2 treated. It is found that the grain boundary interface recombination has a marked effect in degrading Voc, which is consistently difficult to capture in a 1D model of an effective medium. In particular, we show that if the initial I-V curve of polycrystalline CdTe does not exhibit a low Schottky barrier, then Br:MeOH-etching the back will not necessarily improve device performance.

The combination of group-V element doping and Cd-rich composition is the most promising current strategy for maximizing p-type doping while preserving long lifetime. In this study, we carefully measure the equilibrium p-type doping limit for As-doped Cd-rich CdTe single crystals and demonstrate a doping limit in the low 1017 cm−3 range upon slow cooling. We present evidence for self-compensation with rapidly decreasing doping efficiency per added As above 5 × 1016 cm−3, yet we also demonstrate CdTe with >1017 cm−3 hole concentration and bulk lifetime >30 ns. Such crystals allow As-doped CdTe photovoltaic devices with open-circuit voltage exceeding 900 mV.

Cu(In,Ga)Se2 (CIGSe) is a polycrystalline absorber layer in thin film solar cells with solar conversion efficiencies exceeding 20%. High temperature annealing for periods of minutes to hours is currently required to convert amorphous or nanocrystalline precursor material into high quality Cu(In,Ga)Se2 absorber layers. In this work, we perform the critical annealing step, using a 1064 nm laser, on electrodeposited precursor layers containing Cu, In, and Se, for times of 0.3–60 s thus synthesizing CuInSe2 absorber layers. An annealing time of 1 s is found to be sufficient to remove elemental concentration gradients in the bulk of the layer and to increase the average implied crystallite size (crystal coherence length, as determined by X-ray diffraction, XRD). Therefore the rate-determining step in producing higher quality layers with short annealing times is the rate of grain growth and not atomic diffusion. Optoelectronic analysis of the absorber layers revealed p-type doping with improved radiative recomb...

CuInSe2 (CISe) is a prototype material for the I–III–VI chalcopyrites such as Cu(In,Ga)(S,Se)2 used as absorber layers in thin film photovoltaic cells. Carefully-controlled pulsed-laser annealing (PLA) is a unique annealing process that has been demonstrated to improve the device performance of chalcopyrite solar cells. Here, we investigate the changes in defect populations after PLA of electrochemically-deposited CISe thin films previously furnace annealed in selenium vapor. The films were irradiated in the sub-melting regime at fluences inducing temperatures up to 840 ± 100 K. Deep-level transient spectroscopy on Schottky diodes reveals that the activation energy of the dominant majority carrier trap changes non-monotonically from 215 ± 10 meV for the reference sample, to 330 ± 10 meV for samples irradiated at 20 and 30 mJ/cm2, and then back to 215 ± 10 meV for samples irradiated at 40 mJ/cm2. A hypothesis involving competing processes of diffusion of Cu and laser-induced generation of In vacancies may explain this behavior.

Herein we review the remarkable range of modifications to materials properties associated with photoexcitation of the growth surface during physical vapor epitaxy of semiconductors. We concentrate on mechanisms producing measureable, utilizable changes in crystalline perfection, phase, composition, doping, and defect distribution. We outline the relevant physics of different mechanisms, concentrating on those yielding effects orthogonal to the primary growth variables of temperature and atomic or molecular fluxes and document the phenomenological effects reported. Based on experimental observations from a range of semiconductor systems and growth conditions, the primary effects include enhanced anion desorption, molecular dissociation, increased doping efficiency, modification to defect populations and improvements to the crystalline quality of epilayers grown at low temperatures. Future research directions and technological applications are also discussed.

We report observations of minority carrier interactions with deep levels in 6–8% efficient Cu2ZnSn(S, Se)4 (CZTSSe) devices using conventional and minority deep level transient spectroscopy (DLTS) and deep level optical spectroscopy (DLOS). Directly observing defect interactions with minority carriers is critical to understanding the recombination impact of deep levels. In devices with Cu2ZnSn(S, Se)4 nanoparticle ink absorber layers we identify a mid-gap state capturing and emitting minority electrons. It is 590±50 meV from the conduction band mobility edge, has a concentration near 1015/cm3, and has an apparent electron capture cross section ∼10−14 cm2. We conclude that, while energetically positioned nearly-ideally to be a recombination center, these defects instead act as electron traps because of a smaller hole cross-section. In CZTSe devices produced using coevaporation, we used minority carrier DLTS on traditional samples as well as ones with transparent Ohmic back contacts. These experiments demonstrate methods for unambiguously probing minority carrier/defect interactions in solar cells in order to establish direct links between defect energy level observations and minority carrier lifetimes. Furthermore, we demonstrate the use of steady-state device simulation to aid in the interpretation of DLTS results e.g. to put bounds on the complimentary carrier cross section even in the absence its direct measurement. This combined experimental and theoretical approach establishes rigorous bounds on the impact on carrier lifetime and Voc of defects observed with DLTS as opposed to, for example, assuming that all deep states act as strong recombination centers.

Cu 2 ZnSn(S, Se) 4 (CZTSe) is an earth-abundant semiconductor with potential for economical thin-film photovoltaic devices. Short minority carrier lifetimes contribute to low open circuit voltage and efficiency. Deep level defects that may contribute to lower minority carrier lifetimes in kesterites have been theoretically predicted, however very little experimental characterization of these deep defects exists. In this work we use admittance spectroscopy (AS) and deep level transient spectroscopy (DLTS) to characterize devices built using CZTSSe absorber layers deposited via both coevaporation and solution processing. AS reveals a band of widely-distributed activation energies for traps or energy barriers for transport, especially in the solution deposited case. DLTS reveals signatures of deep majority and minority traps within both types of samples.

The CdCl 2 heat treatment (HT) is one of the most critical steps in the fabrication of high efficiency CdTe solar cells. In this study a laser based CdCl 2 treatment is presented. A high power near infrared (808 nm) diode laser was used for laser annealing (LA) CdTe cells. The effect of laser power density (LPD) and annealing time on the devices was studied using photoluminescence (PL), current-voltage and spectral response measurements. PL spectra exhibited a correlation between the LPD and the defect density in CdTe. CdS thinning and narrowing of the CdTe bandgap was observed with increasing LPD and longer anneal times. All solar cell parameters, open-circuit voltage (VOC), short-circuit current (JSC), and fill-factor (FF), improved as a result of the laser annealing compared to as-deposited cells. The LPD was optimized with best cell parameters obtained to-date being: V OC = 800 mV, J SC = 23.34 mA/cm2, and FF= 71 %.

A large amount of current research in thin film photovoltaics based on inorganic semiconductors aims to deposit and process these active layers using inexpensive and low temperature processing methods resulting in high densities of electronic states in the bandgap associated with structural and point defects. We define semiconductors in which the Fermi level is pinned throughout the bulk as being at the defective limit and explore the consequences for heterojunctions designed to separate photocarriers. Using this novel concept of the defective limit, heterojunction band offsets can be predicted for less-common materials such as the earth-abundant materials also under intense investigation. Because of the Fermi level pinning in the bulk, only Type II heterojunctions will separate charges but the high defect concentrations will also result in small minority carrier diffusion lengths. These limitations require the use of nanostructured device architectures for cells of such materials with appreciable power conversion efficiency.

We investigate the light-trapping effects of dielectric nanoparticles embedded within the active semiconductor layer of a thin-film solar cell. The baseline model consists of a 1·0 µm slab of crystalline silicon on an aluminum back contact topped with a 75 nm Si3N4 anti-reflective coating. Using finite-difference time-domain simulations, we calculate the absorption gain due to a periodic array of SiO2 nanospheres with characteristic depth, diameter, and pitch. Under optimal conditions, absorption gain due to embedded spheres can reach as high as 23·4% relative to the baseline geometry. Using Au-core/SiO2-shell nanoparticles, it is even possible to reach 30%. We then infer a series of design principles from our data that include trade-offs between broadband scattering efficiency, poor absorption at long wavelengths, and semiconductor displacement. We also find that the optimal spacing between particles is approximately 400 nm. Above this distance, each scatterer acts in near isolation from any neighboring particles, and absorption gain is approximately linear with area coverage. Such gains are also expected for disordered as well as ordered arrays. These results demonstrate the potential of embedded dielectric nanoparticles as a tool for enhancing carrier generation in thin silicon solar cells. Copyright © 2011 John Wiley & Sons, Ltd.

Tungsten diselenide (WSe2) thin films exhibit ultrafast carrier recombination lifetimes, which makes them promising candidates for high speed modulators. With pulsed optical excitation, they could be used to realize all-optical, frequency agile, terahertz devices. Looking into the potential of this material for such applications, time-resolved terahertz spectroscopy can provide significant insight into its free carrier and exciton dynamics such as recombination lifetimes, photo-induced conductivity and decay pathways. In this study, we measure transient terahertz conductivity and photo-generated carrier lifetimes in custom-grown large-area WSe2 thin-films. We discuss its dependence on grain size and number of layers. By analyzing the tradeoffs between carrier-lifetimes, photo-generated conductivity, grain size, and the number of layers, we show that the response of these films can be tailored by controlling the growth parameters. Customizing the film terahertz response can enable large modulation without the need for integration with bulk semiconductors, as widely reported in the literature, thereby achieve high terahertz photoconductivity and high-speed operation. Across samples, our measurements show carrier decay timescale on the order ~10 to 100 ps and a transient conductivity that shows non-Drude behavior. This deviation from a Drude response is dominant within the first few picoseconds (

The low solubility of Er in GaAs results in the formation of ErAs nanostructures when GaAs is grown with 5–6 at% Er/Ga ratio by molecular beam epitaxy on GaAs surfaces. For growth on the (4 1 1)A GaAs surface, cross-sectional scanning transmission electron microscopy images show the presence of ErAs nanorods embedded in a GaAs matrix extending along the [2 1 1] direction with a spacing of roughly 7 nm and a diameter of roughly 2 nm. Growth on the GaAs (4 1 1)B surface resulted in only nanoparticle formation. Variation of the polarized optical absorption with in-plane polarization angle is consistent with coupling to surface plasmon resonances of the semimetallic nanostructures.

Unintentional doping and doping limits in semiconductors are typically caused by compensating defects with low formation energies. Since the formation enthalpy of a charged defect depends linearly on the Fermi level, doping limits can be especially pronounced in wide bandgap semiconductors where the Fermi level can vary substantially. Introduction of non-equilibrium carrier concentrations during growth or processing alters the chemical potentials of band carriers and allows populations of charged defects to be modified in ways impossible at thermal equilibrium. We demonstrate that in the presence of excess carriers, the rates of carrier capture and emission involving a defect charge transition level determine the admixture of electron and hole quasi-Fermi levels involved in the formation enthalpy of non-zero charge defect states. To understand the range of possible responses, we investigate the behavior of a single donor-like defect as functions of extrinsic doping and charge transition level energy. We find that that excess carriers will increase the formation enthalpy of compensating defects for most values of the charge transition level in the bandgap. Thus, it may be possible to use non-equilibrium carrier concentrations to overcome limitations on doping imposed by native defects. Cases also exist in which the concentration of defects with the same charge polarity as the majority dopant is either left unchanged or actually increases. This surprising effect arises when emission rates are suppressed relative to the capture rates and is most pronounced in wide bandgap semiconductors. We provide guidelines for carrying out experimental tests of this model.

Group-V element doping is promising for simultaneously maximizing the hole concentration and minority carrier lifetime in CdTe for thin film solar cells, but there are roadblocks concerning point defects including the possibility of self-compensation by AX metastability. Herein, we report on doping, lifetime, and mobility of CdTe single crystals doped with As between 1016 and 1020 cm−3 grown from the Cd solvent by the travelling heater method. Evidence consistent with AX instability as a major contributor to compensation in samples doped below 1017 cm−3 is presented, while for higher-doped samples, precipitation of a second phase on planar structural defects is also observed and may explain spatial variation in properties such as lifetime. Rapid cooling after crystal growth increases doping efficiency and mobility for times up to 20–30 days at room temperature with the highest efficiencies observed close to 45% and a hole mobility of 70 cm2/Vs at room temperature. A doping limit in the low 1017/cm3 range is observed for samples quenched at 200–300 °C/h. Bulk minority carrier lifetimes exceeding 20 ns are observed for samples doped near 1016 cm−3 relaxed in the dark and for unintentionally doped samples, while a lifetime of nearly 5 ns is observed for 1018 cm−3 As doping. These results help us to establish limits on properties expected for group-V doped CdTe polycrystalline thin films for use in photovoltaics.

Highly mismatched alloys (HMAs) are dilute alloys whose fundamental properties are dramatically modified through the substitution of a relatively small fraction (up to ∼5%) of host atoms with a very different element. Specific examples are dilute III–V nitrides (e.g. GaN x As 1− x ) and II–VI oxides (e.g. ZnO x Te 1− x ) in which the conduction bands are strongly modified by the anticrossing interaction between localized states of O or N and the extended states of the semiconductor matrix. Using a highly non-equilibrium method: the combination of ion implantation and pulsed laser melting (II-PLM) we have synthesized a wide variety of III-N x -V 1− x and II-O x -VI 1− x alloys with N or O content up to 2%. The structural and optical properties of these HMAs have been systematically investigated. In particular, we demonstrated that the Zn 1− y Mn y O x Te 1− y dilute oxide is a multiband alloy that can be used for the realization of the single junction, high efficiency intermediate band solar cells.

The performance of polycrystalline CdTe photovoltaic thin films is expected to depend on the grain boundary density and corresponding grain size of the film microstructure. However, the electrical performance of grain boundaries within these films is not well understood, and can be beneficial, harmful, or neutral in terms of film performance. Electron backscatter diffraction has been used to characterize the grain size, grain boundary structure, and crystallographic texture of sputtered CdTe at varying deposition pressures before and after CdCl2 treatment in order to correlate performance with microstructure. Weak fiber textures were observed in the as-deposited films, with (111) textures present at lower deposition pressures and (110) textures observed at higher deposition pressures. The CdCl2-treated samples exhibited significant grain recrystallization with a high fraction of twin boundaries. Good correlation of solar cell efficiency was observed with twin-corrected grain size while poor correlation was found if the twin boundaries were considered as grain boundaries in the grain size determination. This implies that the twin boundaries are neutral with respect to recombination and carrier transport.

Post-deposition laser processing of CdTe has potential for reducing manufacturing costs of CdTe PV modules. In this work we demonstrate the applicability of lasers to thermally processing CdTe modules by using a continuous wave Nd:YAG 1064 nm laser to drive CdCl2 treatment of CdTe. The data show that, similar to traditional annealing, laser annealing for only 15 seconds at higher than typical temperatures, the annealed CdTe displays an increase in A-center peak (1.435 eV) in photoluminescence yield. These indicate that chlorine activation of the absorber layer occurs in a mere 15 s and demonstrates the potential of accelerating the post-deposition CdCl2 treatment of CdTe by utilizing laser annealing at higher temperatures.

We have synthesized ternary and quaternary diluted II-VI oxides using the combination of O ion implantation and pulsed laser melting. CdO{sub x}Te{sub 1-x} thin films with x up to 0.015, and the energy gap reduced by 150 meV were formed by O{sup +}-implantation in CdTe followed by pulsed laser melting. Quaternary Cd{sub 0.6}Mn{sub 0.4}O{sub x}Te{sub 1-x} and Zn{sub 0.88}Mn{sub 0.12}O{sub x}Te{sub 1-x} with mole fraction of incorporated O as high as 0.03 were also formed. The enhanced O incorporation in Mn-containing alloys is believed to be due to the formation of relatively strong Mn-O bonds. Optical transitions associated with the lower (E{sub -}) and upper (E{sub +}) conduction subbands resulting from the anticrossing interaction between the localized O states and the extended conduction states of the host are clearly observed in these quaternary diluted II-VI oxides. These alloys fulfill the criteria for a multiband semiconductor that has been proposed as a material for making high efficiency, single-junction solar cells.

Using oxygen ion implantation and pulsed laser melting, we have synthesized thin films of highly mismatched ternary (y = 0) and quaternary (y = 0.12) Zn 1-y Mn y O x Te 1-x alloys with oxygen content in excess of x ∼ 0.01. We show that incorporation of a small amount of isoelectronic oxygen leads to the formation of a narrow, oxygen-derived band of extended states located well below the conduction band edge of the Zn 1-y Mn y Te matrix. The structure of the conduction band is well described by the anticrossing interaction between O localized states and the extended states of the host semiconductor matrix. As a result the conduction band splits into two subbands with distinctly non-parabolic dispersion relations. The three absorption edges of this material (-0.73, 1.83 and 2.56 eV) cover the entire solar spectrum providing a material envisioned for the multi-band, single junction, high efficiency photovoltaic devices.

We present a systematic investigation on the formation of the highly mismatched alloy GaN{sub x}As{sub 1-x} using N{sup +}-implantation followed by a combination of pulsed laser melting and rapid thermal annealing. Thin films of GaN{sub x}As{sub 1-x} with x as high as 0.016 and an activation efficiency of the implanted N up to 50% have been synthesized with structural and optical properties comparable to films grown by epitaxial deposition techniques with similar substitutional N content. The effects of N{sup +} implantation dose, laser energy fluence and rapid thermal annealing temperature on the N incorporation as well as optical and structural properties of the GaN{sub x}As{sub 1-x} films are discussed.

We investigate how post-deposition laser annealing can be used to improve structural and electronic quality of room-temperature deposited CdTe. We use continuous-wave, 1064 nm laser light to anneal CdTe solar cell stacks prior to back contact deposition. Sub-bandgap optical absorption measurements by photothermal deflection spectroscopy show a reduction of sub-bandgap defects due to the annealing process. Since the 1064 nm light is only partially absorbed, in situ monitoring of the transmitted light during laser annealing gives real-time information about changes in the material. These results reveal an evolution of electronic defect annealing and surface roughness modification with laser exposure time. This hypothesis is supported by electron microscopy. Two distinct annealing regimes emerge: one at low laser power where electronic defect annealing saturates after about one minute exposure and another at high power where structural defects are annealed after several minutes exposure. Temperatures reached during laser annealing are estimated by finite element modeling of the thermal transport due to heat generation from optical absorption.

We describe how the techniques of X-ray reflectivity (XRR), electron spectroscopy for chemical analysis (ESCA), and atomic force microscopy (AFM) can be used to obtain the structural parameters-thickness, coverage, and topography-of thin films used on magnetic recording disks. We focus on ultra-thin amorphous nitrogenated carbon (CNx) overcoats on disks. Each technique has its own strengths: XRR measures film thickness absolutely, ESCA determines the chemical composition of the films, and AFM maps topography accurately. For the CNx overcoats investigated, we find incomplete coverage for thicknesses less than 20 /spl Aring/, and we find a small surface roughness with rms roughness /spl les/11 /spl Aring/.

Presented here are the results of a three dimensional, finite element simulation that models pulsed, ultraviolet (UV) laser annealing of polycrystalline CdTe. The model considers heat generated by the absorption of a 25 ns, 248 nm laser pulse normally incident to a 5 μm thick CdTe thin film deposited on a polycrystalline alumina substrate. In particular, focus is on the spatial and temporal distribution of temperature from laser fluences that achieve a sub-melting condition. The model shows that there are very large temperature gradients both in depth and in-plane directions. These predictions, as well as the onset of melting, are confirmed with cross sectional scanning electron microscopy. Additionally, the model predicts that the heat generated dissipates rapidly after the pulse has ended. This has implications if pulse trains are to be used experimentally.

For the production of high efficiency thin film, Cu(In,Ga)Se2 solar cells, absorber layers with grain sizes of a few hundred nanometers and without detrimental secondary phases are favored. Co-electrodeposition offers a low-cost and material efficient synthesis route, where, in a single step, films containing CuInSe2 are formed. However, the material is nanocrystalline, constitutes multiple phases and has poor photovoltaic properties 1. Therefore a subsequent annealing step is required to produce absorber layers suitable for use in photovoltaic devices. Laser annealing has been demonstrated to improve crystallinity, stimulate atomic diffusion and develop opto-electronic properties when compared to the precursor 2. In this work, high resolution X-ray diffraction was used in order to assess the presence of secondary phases in the absorber layer. All diffractograms of laser annealed films exhibited an additional, unknown peak, measurable through the full depth of the material which is independent of precursor composition, annealing time or laser flux. Evaluation of literature on codeposited CuInSe2, combined with Rietveld refinement suggests a number of possible identities for this peak. The candidates in order of most likely to least likely are structural defects, In2Se3, and CuIn3Se5. We consider the impact that each of these would have on a device formed via this process and thus its success as a new manufacturing route for CuInSe2 solar cells.