5 results on '"Lee, Jinju"'
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2. Improved hot-carrier reliability of SOI transistors by deuterium passivation of defects at oxide/silicon interfaces
3. Deuterium isotope effect for AC and DC hot-carrier degradation of MOS transistors: a comparison study
4. An alternative interpretation of hot electron interface degradation in NMOSFET's: isotope results irreconcilable with major defect generation by holes?
5. The effect of deuterium passivation at different steps of CMOS processing on lifetime improvements of CMOS transistors
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