We investigate light-scattering textures for the application in thin-film solar cells which consist of a random texture, as commonly applied in thin-film solar cells, that are superimposed with a two-dimensional grating structure. Those textures are called photonic random texture. A scalar optical model is applied to describe the light-scattering properties of those textures. With this model, we calculate the angular resolved light scattering into silicon in transmission at the front contact and for reflection at the back contact of a microcrystalline silicon solar cell. A quantity to describe the light- trapping efficiency is derived and verified by rigorous diffraction theory. We show that this quantity is well suitable to predict the short-circuit current density in the light-trapping regime, where the absorptance is low. By varying the period, height and shape of the unit cell, we optimize the grating structure with respect to the total generated current density. The maximal predicted improvement in the spectral range from 600-900 nm is found to be about 3 mA/cm² compared to the standard random texture and about 6 mA/cm² compared to a flat solar cell. Different light-trapping concepts were applied in silicon-based thin-film solar cells to overcome the limitations due to the low absorptance near the band gap for flat devices 1,2 and the limited device thickness due to light-induced degradation. Differently textured interfaces improve light coupling into the absorber material and provide light guidance in the layer. Mostly, random textures were incorporated that scatter incoming light diffusely prolonging the effective light path. 3-6 Recent work was done by several groups where periodic structures, e.g. gratings or photonic crystals, were incorporated at different interfaces of the device. 7-12 The complex surface structures demand for rigorous optical models with high computational effort and huge memory in order to describe their impact on light absorption. With such models, optimizations are only possible in strictly limited parameter spaces to fix into computer capacities availably nowadays. We recently demonstrated that the angular resolved scattering in transmission and reflection inside the silicon absorber material can be sufficiently described by a simple scalar approach. 13-15 This simple model allows optimization of the interface structure in a huge parameter space with low computational effort. We found that the amount of light scattered beyond the critical angle of total internal reflection correlates nicely to the external quantum efficiency. Therefore, this investigation was done in the spectral range, where light trapping is mostly efficient (600-900 nm) and the short-circuit current density was derived for this spectral range (jsc,600-900). We interpret this quantity as a benchmark for the efficiency of the light-trapping texture and carry out the optimum. In this work, we investigated in detail the combination of both, random texture and periodic structure. Starting with a randomly textured ZnO:Al layer, that is well-known to provide high-efficiency microcrystalline silicon (µc-Si:H) solar cells, we superimposed a two-dimensional periodic structure with optimized period and height to the random texture. The design of the structure was done by applying the scalar approach. Our results from the simple scalar approach were verified by Finite-Difference Time-Domain (FDTD) simulations of the real layer stack for selected structures. In detail, we optimized the period and height of different unit cell geometries. Those gratings were applied to flat interfaces, leading to photonic textures, and the randomly textured ZnO:Al layer, leading to photonic random textures. The jsc,600-900 for the flat and random reference cell were found to be 6.48 mA/cm² and 9.32 mA/cm², respectively. The largest short-circuit current density we found is jsc,600-900=12.40 mA/cm². This is an improvement of about 6 mA/cm² compared to the flat cell and still about 3 mA/cm² compared to the standard random texture.