1. A Short Review on Raman Studies of Metal Chalcogenide Semiconductor Thin Films
- Author
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S.M. Ho, M.R. Adam, M.H.D. Othman, and K. Mohanraj
- Subjects
010302 applied physics ,Semiconductor thin films ,business.industry ,Chalcogenide ,02 engineering and technology ,General Chemistry ,021001 nanoscience & nanotechnology ,01 natural sciences ,Metal ,Condensed Matter::Materials Science ,chemistry.chemical_compound ,symbols.namesake ,chemistry ,visual_art ,0103 physical sciences ,visual_art.visual_art_medium ,symbols ,Optoelectronics ,0210 nano-technology ,business ,Raman spectroscopy - Abstract
The productions of the thin metallic chalcogenide films are of particular interest for the wide range of fabrication of the solar cells, sensors, photodiode arrays, photoconductors. Raman spectroscopy is used to measure the scattering radiation of a matter. Basically, the spectroscopic methods can be defined as the study of the interaction of electromagnetic radiation with a matter. It can be based on the phenomenon of absorption, fluorescence, emission or scattering. The observation of peaks supported the formation of amorphous or crystalline nature of the samples. In this short review, the authors had gathered some informations about the Raman studies of recently synthesized metal chalcogenide semiconductor thin films.
- Published
- 2021