1. A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)
- Author
-
S. T. Ivancic, C. R. Stillman, Dustin Froula, D. D. Meyerhofer, P. M. Nilson, D. J. Lonobile, Christian Stoeckl, Manfred Bitter, D. Mastrosimone, P. C. Efthimion, J. Hassett, C. Taylor, Chad Mileham, W. Theobald, R. W. Kidder, Milton J. Shoup, F. Ehrne, A. A. Solodov, K. W. Hill, Lan Gao, Robert Boni, and R. Jungquist
- Subjects
Physics ,X-ray spectroscopy ,Spectrometer ,business.industry ,Streak camera ,Astrophysics::High Energy Astrophysical Phenomena ,Laser ,01 natural sciences ,010305 fluids & plasmas ,law.invention ,Optics ,law ,Picosecond ,0103 physical sciences ,Emission spectrum ,010306 general physics ,business ,Spectroscopy ,Instrumentation ,Ultrashort pulse - Abstract
A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu Kα1 line. To demonstrate the performance of the spectrometer under high-power conditions, Kα1,2 emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 1018 W/cm2. The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed.
- Published
- 2016