1. Lateral shearing interferometry of high-harmonic wavefronts
- Author
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Austin, DR, Witting, T, Arrell, CA, Frank, F, Wyatt, AS, Marangos, JP, Tisch, JWG, Walmsley, IA, and Tisch, JW
- Subjects
Physics ,Wavefront ,Shearing (physics) ,Spectrometer ,business.industry ,Laser ,Atomic and Molecular Physics, and Optics ,law.invention ,Interferometry ,Optics ,law ,Electronic speckle pattern interferometry ,Extreme ultraviolet ,Harmonics ,business - Abstract
We present a technique for frequency-resolved wavefront characterization of high harmonics based on lateral shearing interferometry. Tilted replicas of the driving laser pulse are produced by a Mach-Zehnder interferometer, producing separate focii in the target. The interference of the resulting harmonics on a flat-field extreme ultraviolet spectrometer yields the spatial phase derivative. A comprehensive set of spatial profiles, resolved by harmonic order, validate the technique and reveal the interplay of single-atom and macroscopic effects. © 2011 Optical Society of America.
- Published
- 2011