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This work investigates the endurance and performance of aluminum-doped zinc oxide (AZO) thin films fabricated on flexible polyethylene terephthalate (PET) substrates, providing new insights into their degradation linked to mechanical flexing and accelerated thermal cycling (ATC). The current study uniquely combines cyclic bending fatigue at 23 °C and 70 °C with ATC between 0 °C and 100 °C, simulating operational stresses in real-world environments, in contrast to previous research that has focused primarily on either isolated mechanical or thermal effects. The 425 nm thick films showed high transparency and conductivity, making them suitable materials for flexible electronics and optoelectronic devices. In this work, electrical resistivity, one of the most important performance parameters, was investigated after each mechanical or thermal cycle. The results indicate that mechanical cycling at high temperatures can drastically enhance the crack formation and electrical degradation, with an over 250% change in the electrical resistance (PCER) after 12,000 cycles at 70 °C and more than 300% after 500 thermal cycles. The highly deleterious effects of combined stressors on the structural integrity and electrical properties of AZO films are underlined by these observations. This study further suggests that the design of more robust AZO-based materials/coatings would contribute toward achieving better durability in flexible electronic applications. These findings also go hand in glove with the ninth goal of the United Nations' Sustainable Development Goals, specifically Target 9.5: Enhance Research and Upgrade Industrial Technologies. [ABSTRACT FROM AUTHOR]