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We provide an overview of our progress on the development of linear mode avalanche photodiodes (LmAPDs) on InP substrates using antimony (Sb)-based multipliers for short-wavelength infrared (SWIR) spectral region. We identify the key figures of merit of LmAPDs to provide higher sensitivity and speed for applications like light detection and ranging (LiDAR) and remote sensing. We discuss the design of separate absorption, charge, and multiplication (SACM) APDs that are used for narrow gap absorption. We summarize our results on the impact ionization, multiplication gain, dark current, and excess noise of AlGaAsSb and AlInAsSb multipliers lattice-matched to InP substrates. Finally, we identify the key technical challenges associated with the development of SACM APDs on InP substrates. [ABSTRACT FROM AUTHOR]

Digital alloy and random alloy Al0.85Ga0.15As0.56 Sb0.44 avalanche photodiodes (APDs) exhibit low excess noise, comparable to Si APDs. Consequently, this material is a promising multiplication layer candidate for separate absorption, charge, and multiplication structure APDs with high gain-bandwidth product. Characterization of the impact ionization coefficients of electrons (α) and holes (β) plays an important role in the simulation of avalanche photodiodes. The multiplication gain curves of eight p+-i-n+ and n+-i-p+ APDs covering a wide range of avalanche widths have been used to determine the electric field dependence of the impact ionization coefficients of Al0.85Ga0.15As0.56Sb0.44. A large impact ionization coefficient ratio between that of electrons to holes was seen across a wide electric field range. Simulations of the avalanche multiplication in these structures using a random path length (RPL) model gave good agreement with experimental results over almost three orders of magnitude, and a mixed injection method was employed to verify the extracted impact ionization coefficients. Interestingly, no difference in the impact ionization coefficients was seen between digital alloy and random alloy Al0.85Ga0.15As0.56Sb0.44. This knowledge of impact ionization coefficients is beneficial for the future utilization of the AlxGa1-xAsySb1-y material system. [ABSTRACT FROM AUTHOR]

Avalanche photodiodes (APDs) made with the material AlGaAsSb (lattice-matched to InP) exhibit very low excess noise characteristics. We demonstrate a Separate Absorption and Multiplication APD (SAM-APD) incorporating a GaAs0.52Sb0.48 (GaAsSb) absorption region and an Al0.85Ga0.15As0.56Sb0.44 (AlGaAsSb) avalanche region. Our GaAsSb/AlGaAsSb SAM-APD exhibits a cut-off wavelength of 1.70 μm at room temperature and a responsivity of 0.39 A/W at 1.55 μm wavelength (with no antireflection coating). Temperature dependence of the breakdown voltage was obtained from avalanche gain data from multiple devices operated at 77 to 295 K. This produced a temperature coefficient of breakdown voltage of 4.31±0.33 mV/K, a factor of 10 and 5 smaller than values for comparable InP and InAlAs SAM-APDs. The very small temperature coefficient of this work is consistent with the extremely weak temperature dependence of avalanche breakdown previously observed in AlGaAsSb diodes. [ABSTRACT FROM AUTHOR]

Avalanche breakdown characteristics are essential for designing avalanche photodiodes. In this letter, we investigated the effects of adding Ga to Al1–xGaxAs0.56Sb0.44 quaternary alloys. Using p-i-n diodes with a 100-nm i—region and alloy composition ranging from $x=0$ to 0.15, we found that the bandgap energy of Al1–xGaxAs0.56Sb0.44 reduces from 1.64 to 1.56 eV. The corresponding avalanche breakdown voltage decreases from 13.02 to 12.05 V, giving a reduction of 64.7 mV for every percent addition of Ga. The surface leakage current was also found to be significantly lower in the diodes with $x=0.10$ and 0.15 suggesting that Ga can be added to reduce the surface leakage current while still preserving the lattice match to InP substrate. The data from this letter can be downloaded freely. [ABSTRACT FROM PUBLISHER]